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New Insights into Emission Tomography Via Linear Programming

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Medical Images: Formation, Handling and Evaluation

Part of the book series: NATO ASI Series ((NATO ASI F,volume 98))

Abstract

Suppose that each detector unit, d, of an emission scanner measures a count n*(d) which represents the number of emissions into d of an unknown emission density λ.The likelihood, P(n*|λ), is the (Poisson) probability of observing n* under λ.The well-known EM algorithm starts with an estimate λ° of λ and produces a sequence λk, k=l,2,…, of estimators having increasing likelihood and which converge to an estimate λx with maximum likelihood as k→∞. It is well-known that for large k, λk becomes snowy or noisy in appearance, and various methods have been proposed to effectively smooth λk, but these all give up likelihood to get smoothness. We give a method using linear programming of smoothing λk which produces a smoother estimate λk which nevertheless has the same likelihood as λk.

If λk is nearly unique among estimators with its likelihood then λk cannot differ much from λk, while of there are many λ with the likelihood of λk, then λk should be smooth. Experiments described here indicate that for large k, λk is not much smoother than λk, so that λk seems to be nearly unique. This is surprising in view of the fact the problem considered is severely undetermined in the sense that there are typically 3 or more times as many unknowns as equations (measurements), but of course it is the inequality constraints that cause the uniqueness.

We survey the maximum likelihood approach to emission tomography using the iterative EM algorithm and discuss the known difficulty with the algorithm at high iteration numbers.

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© 1992 Springer-Verlag Berlin Heidelberg

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Shepp, L.A., Vanderbei, R.J. (1992). New Insights into Emission Tomography Via Linear Programming. In: Todd-Pokropek, A.E., Viergever, M.A. (eds) Medical Images: Formation, Handling and Evaluation. NATO ASI Series, vol 98. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-77888-9_3

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  • DOI: https://doi.org/10.1007/978-3-642-77888-9_3

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-77890-2

  • Online ISBN: 978-3-642-77888-9

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