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Use of a Resistive SQUID for Noise Thermometry

  • R. J. SoulenJr.
  • W. E. Fogle
  • J. H. Colwell
Part of the Springer Proceedings in Physics book series (SPPHY, volume 64)

Abstract

The recently-developed international temperature scale, ITS 90, does not extend below 0.65K. However, a considerable body of research, particularly that devoted to defining the physical properties of liquid 3He, has been conducted below this temperature without benefit of a common temperature scale. Accordingly, we have been developing a temperature scale in this region. The primary thermometer used in this effort is a special form of noise thermometer consisting of a resistively- shunted Josephson junction, or an R-SQUID. The R-SQUID offers advantages over conventional analogue noise thermometry in that the influence of the measuring circuits on the measured noise temperature is considerably reduced. A review is given of the decade of experience gained at NIST in the operation of this thermometer and in modelling its systematic errors. The reproducibility of the temperatures measured using the R-SQUID noise thermometer will also be presented, as well as comparisons of the noise temperature scale with scales defined by other thermometers.

Keywords

Josephson Junction Noise Temperature Johnson Noise Noise Thermometer Cerium Magnesium Nitrate 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. [1]
    R. A. Kamper and J. E. Zimmerman, J. Appl Phys. 42, 132, 1971.ADSCrossRefGoogle Scholar
  2. [2]
    J. A. Barnes, A. R. Chi, L. S. Cutler, D. J. Healey, D. B. Leeson, T. E. McGunigal, J. A. Mullen, W. L. Smith, R. Snydor, R. F. C. Vessot, and G. M. Winkler, IEEE Trans Instru. Meas. IM-20(2), 105, 1971.Google Scholar
  3. [3]
    R. J. Soulen, Jr., Deborah Van Vechten, and H. Seppa, Rev. Sci. Instru. 53, 1355, 1982.ADSCrossRefGoogle Scholar
  4. [4]
    R. J. Soulen, Jr, W. E. Fogle, and J. H. Colwell, to be published.Google Scholar
  5. [5]
    R. J. Soulen, Jr. and R. B. Dove, NBS Special Publication 260–44, US Govt. Printing Office; 003-003-02047-8,1979.Google Scholar
  6. [6]
    R. J. Soulen, Jr. and H. Marshak, Cryogenics 7, 408 (1980).ADSCrossRefGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1992

Authors and Affiliations

  • R. J. SoulenJr.
    • 1
  • W. E. Fogle
    • 1
  • J. H. Colwell
    • 1
  1. 1.National Institute of Standards and TechnologyGaithersburgUSA

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