In-Situ YBa2Cu3O7/SrTiO3/YBa2Cu3O7 a-b Plane Josephson Edge Junctions
YBCO/SrTiO3/YBCO thin film edge junctions were prepared in-situ and characterized. The epitaxial growth of SrTiO3 on YBCO led to a sharp and well defined junction edge with a very high yield. Typical junctions showed critical currents up to 83 K, with Ic ∝ (1 — T/Tc)2 temperature dependence. Sharp Shapiro steps were observed under microwave radiation at temperatures up to 82 K. A typical diffraction pattern was found in the voltage response of the junctions to transverse magnetic field.
KeywordsMicrowave Radiation YBCO Film Acid Etching Voltage Response Shapiro Step
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- 5.G. Koren, E. Polturak, E. Aharoni, and D. Cohen, Submitted to Appi. Phys. Lett. (1991)Google Scholar