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In-Situ YBa2Cu3O7/SrTiO3/YBa2Cu3O7 a-b Plane Josephson Edge Junctions

  • E. Aharoni
  • G. Koren
  • E. Polturak
  • D. Cohen
  • E. Iskevitch
Conference paper
Part of the Springer Proceedings in Physics book series (SPPHY, volume 64)

Abstract

YBCO/SrTiO3/YBCO thin film edge junctions were prepared in-situ and characterized. The epitaxial growth of SrTiO3 on YBCO led to a sharp and well defined junction edge with a very high yield. Typical junctions showed critical currents up to 83 K, with Ic ∝ (1 — T/Tc)2 temperature dependence. Sharp Shapiro steps were observed under microwave radiation at temperatures up to 82 K. A typical diffraction pattern was found in the voltage response of the junctions to transverse magnetic field.

Keywords

Microwave Radiation YBCO Film Acid Etching Voltage Response Shapiro Step 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1992

Authors and Affiliations

  • E. Aharoni
    • 1
  • G. Koren
    • 1
  • E. Polturak
    • 1
  • D. Cohen
    • 1
  • E. Iskevitch
    • 1
  1. 1.Physics Department and the Crown Center for SuperconductivityTechnion-Israel Institute of TechnologyHaifaIsrael

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