Abstract
We suggest a selfconsistent theory of the rf-SQUID voltage-current characteristic (VCC) fine structure with account of the intrinsic noise of the interferometer which allows to investigate analytically the VCC plateau structure with the aid of relatively simple equations for slow variables. The outline of the noiseless version of the theory has been published in [1].
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References
Ya. S. Greenberg, J. Techn. Phys. 57, 2392 (1987) (in Russian).
L. D. Jackel, R. A. Buhrmann, J. Low Temp. Phys. 19, 201 (1975).
I. M. Dmitrenko, V. A. Khlus, G. M. Tsoi, V. I. Snyrkov, IEEE Trans. Magn. 19. 576 (1983)
I. M. Dmitrenko, D. A. Konotop, G. M. Tsoi, V. I. Snyrkov, Proc. 10th Int. Conf. Helsinki, Finland, 31 July–3 Aug., 746 (1984).
N. V. Golyshev, S. V. Motorin, in: “Measuring and Computing Systems” Novosibirsk Electro technical Institute, 40 (1989) (in Russian).
V. V. Danilov, K. K. Likharev, O. V. Snigirev, in: SQUID’80, Eds.: H.-D. Hahlbohm, H. Lübbig, Berlin, New York: W. de Gruyter, 473 (1980).
J. Kurkijärvi, Phys. Rev. 6B, 832 (1972).
J. Kurkijärvi, J. Appi. Phys. 44, 3729 (1973).
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© 1992 Springer-Verlag Berlin Heidelberg
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Greenberg, Y.S. (1992). Self-Consistent Theory of the Voltage-Current Characteristic and Intrinsic Noise of the Hysteretic RF-SQUID. In: Koch, H., Lübbig, H. (eds) Superconducting Devices and Their Applications. Springer Proceedings in Physics, vol 64. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-77457-7_43
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DOI: https://doi.org/10.1007/978-3-642-77457-7_43
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