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Characterization of Normal/Superconducting Interfaces: A Novel Technique

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Superconducting Devices and Their Applications

Part of the book series: Springer Proceedings in Physics ((SPPHY,volume 64))

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Abstract

A new technique for demonstrating the presence of a proximity effect in a thin superconductor/normal metal bilayer has been demonstrated. It is based on a measurement of the kinetic inductance of the film, which shows a characteristic deviation from the temperature dependence of a single superconducting film at moderately low temperatures. The effect has been observed in Nb/Cu and NbN/Al bilayers, and should be applicable to high temperature superconductors as well. The results are very sensitive to cleanliness of the interface, as is expected for the proximity effect.

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References

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Author information

Authors and Affiliations

  1. Naval Research Laboratory, Code 6344, Washington, DC, 20375, USA

    J. H. Claassen

  2. Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge, CB2 3QZ, UK

    J. E. Evetts, R. E. Somekh & Z. H. Barker

Authors
  1. J. H. Claassen
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  2. J. E. Evetts
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  3. R. E. Somekh
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  4. Z. H. Barker
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Editor information

Editors and Affiliations

  1. Institut Berlin, Physikalisch-Technische Bundesanstalt, Abbestraße 2-12, W-1000, Berlin 10, Fed. Rep. of Germany

    Hans Koch  & Heinz Lübbig  & 

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© 1992 Springer-Verlag Berlin Heidelberg

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Claassen, J.H., Evetts, J.E., Somekh, R.E., Barker, Z.H. (1992). Characterization of Normal/Superconducting Interfaces: A Novel Technique. In: Koch, H., Lübbig, H. (eds) Superconducting Devices and Their Applications. Springer Proceedings in Physics, vol 64. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-77457-7_103

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  • DOI: https://doi.org/10.1007/978-3-642-77457-7_103

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-77459-1

  • Online ISBN: 978-3-642-77457-7

  • eBook Packages: Springer Book Archive

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