Characterization of Normal/Superconducting Interfaces: A Novel Technique
A new technique for demonstrating the presence of a proximity effect in a thin superconductor/normal metal bilayer has been demonstrated. It is based on a measurement of the kinetic inductance of the film, which shows a characteristic deviation from the temperature dependence of a single superconducting film at moderately low temperatures. The effect has been observed in Nb/Cu and NbN/Al bilayers, and should be applicable to high temperature superconductors as well. The results are very sensitive to cleanliness of the interface, as is expected for the proximity effect.
KeywordsContact Resistance High Temperature Superconductor Mutual Inductance Proximity Effect Normal Metal
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