Characterization of Normal/Superconducting Interfaces: A Novel Technique
A new technique for demonstrating the presence of a proximity effect in a thin superconductor/normal metal bilayer has been demonstrated. It is based on a measurement of the kinetic inductance of the film, which shows a characteristic deviation from the temperature dependence of a single superconducting film at moderately low temperatures. The effect has been observed in Nb/Cu and NbN/Al bilayers, and should be applicable to high temperature superconductors as well. The results are very sensitive to cleanliness of the interface, as is expected for the proximity effect.
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