Characterization of Normal/Superconducting Interfaces: A Novel Technique

  • J. H. Claassen
  • J. E. Evetts
  • R. E. Somekh
  • Z. H. Barker
Conference paper
Part of the Springer Proceedings in Physics book series (SPPHY, volume 64)

Abstract

A new technique for demonstrating the presence of a proximity effect in a thin superconductor/normal metal bilayer has been demonstrated. It is based on a measurement of the kinetic inductance of the film, which shows a characteristic deviation from the temperature dependence of a single superconducting film at moderately low temperatures. The effect has been observed in Nb/Cu and NbN/Al bilayers, and should be applicable to high temperature superconductors as well. The results are very sensitive to cleanliness of the interface, as is expected for the proximity effect.

Keywords

Depression Coherence 

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Copyright information

© Springer-Verlag Berlin Heidelberg 1992

Authors and Affiliations

  • J. H. Claassen
    • 1
  • J. E. Evetts
    • 2
  • R. E. Somekh
    • 2
  • Z. H. Barker
    • 2
  1. 1.Naval Research Laboratory, Code 6344USA
  2. 2.Department of Materials Science and MetallurgyUniversity of CambridgeCambridgeUK

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