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Technical Drawing Analysis: SSPR’90 Working Group Report

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Structured Document Image Analysis

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Abstract

This report summarizes the discussions of the Working Group on Technical Drawing Analysis of the IAPR 1990 Workshop on Syntactic and Structural Pattern Recognition, Murray Hill, NJ, 13–15 June 1990. Approximately twelve persons attended this session. We were charged with the task of identifying sound methods and open problems in computer-based or computer-assisted analysis of technical drawings. The discussion was moderated by Stephen Joseph and recorded by Eric Saund.

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Author information

Authors and Affiliations

  1. Xerox Palo Alto Research Center, 3333 Coyote Hill Rd, Palo Alto, CA, 94304, USA

    Eric Saund

  2. Department of Mechanical Engineering, Sheffield University, Mappin Street, Sheffield, S1 3JD, UK

    Steven H. Joseph

Authors
  1. Eric Saund
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  2. Steven H. Joseph
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Editor information

Editors and Affiliations

  1. Computing Science Research Center, AT&T Bell Laboratories, 600 Mountain Avenue, Room 2C-322, P. O. Box 636, 07974-0636, Murray Hill, NJ, USA

    Henry S. Baird

  2. Institut für Informatik und angewandte Mathematik, Universität Bern, Länggass-Str. 51, CH-3012, Bern, Switzerland

    Horst Bunke

  3. Machine Understanding Division, Electrotechnical Laboratory, 1-1-4, Umezono, 305, Tsukuba Science City Ibaraki, Japan

    Kazuhiko Yamamoto

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© 1992 Springer-Verlag Berlin Heidelberg

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Saund, E., Joseph, S.H. (1992). Technical Drawing Analysis: SSPR’90 Working Group Report. In: Baird, H.S., Bunke, H., Yamamoto, K. (eds) Structured Document Image Analysis. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-77281-8_31

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  • DOI: https://doi.org/10.1007/978-3-642-77281-8_31

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-77283-2

  • Online ISBN: 978-3-642-77281-8

  • eBook Packages: Springer Book Archive

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