Single-Electron Tunneling Effects at the Surfaces of Oxide Superconductor Films

  • I. Takeuchi
  • J. S. Tsai
  • S. Ishizaka
  • T. Yoshitake
  • S. Satoh
  • J. Fujita
Conference paper
Part of the Springer Series in Electronics and Photonics book series (SSEP, volume 31)

Abstract

We have studied charging effects arising from tunnel junctions with ultrasmall capacitances using a cryogenic STM. Our samples are evaporated thin films of high temperature superconductors whose surface morphology is often rich in microstructures. All our measurements are made at 4.2K and above, and after approaching the surface, I-V characteristics are obtained. The I-V curves often displayed characteristics arising from the Coulomb blockade of ultrasmall tunneling junctions. In one measurement, we have observed clearly what appeared to be microwave induced current steps possibly due to the SET oscillations. Some of the results are compared with numerical calculations.

Keywords

Microwave Graphite Helium Soliton Flange 

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References

  1. [1]
    P.J.M. van Bentum, H. van Kempen, L.E.C. van de Leemput, P.A.A. Teunissen, Phys.Rev.Lett. 60, 369(1988)CrossRefADSGoogle Scholar
  2. [2]
    R. Wilkins, E. Ben-Jacob, and R.C. Jaklevic, Phys.Rev.Lett. 63, 801(1989)CrossRefADSGoogle Scholar
  3. [3]
    Z.Y. Rong, L.F. Cohen, and E.L. Wolf, Phys.Lett. A146, 281(1990)ADSGoogle Scholar
  4. [4]
    M. Amman, R. Wilkins, E. Ben-Jacob, P.D. Maker, R.C. Jaklevic, Phys.Rev. B43,1146(1991)ADSGoogle Scholar
  5. [5]
    K.A. McGreer, J-C. Wan, N. Anand, and A.M. Goldman, Phys.Rev.B39, 12260(1989)ADSGoogle Scholar
  6. [6]
    I. Takeuchi, J.S. Tsai, S. Ishizaka, T. Yoshitake, and S. Satoh, to appear in the proceedings of Materials and Mechanisms of Superconductivity, High Temperature Superconductors IIIGoogle Scholar
  7. [7]
    T.A. Fulton and G.J. Dolan, Phys.Rev. B59, 109(1987)ADSGoogle Scholar
  8. [8]
    P. Delsing, T. Claeson, K.K. Likharev, and L.S. Kuzmin, Phys.Rev. B42, 7439(1990)ADSGoogle Scholar
  9. [9]
    L.J. Geerlings, V.F. Anderegg, P.A.M. Holweg, J.E. Mooij, H.Pothier, D.Esteve, C.Urbina, and M.H. Devoret, Phys.Rev.Lett. 64, 2691(1990)CrossRefADSGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1992

Authors and Affiliations

  • I. Takeuchi
    • 1
  • J. S. Tsai
    • 1
  • S. Ishizaka
    • 1
  • T. Yoshitake
    • 1
  • S. Satoh
    • 1
  • J. Fujita
    • 1
  1. 1.Fundamental Research LaboratoriesNEC CorporationTsukuba, IbarakiJapan

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