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Quantum Fluctuation and Disappearance of the Josephson Effect in Highly Resistive Microbridges

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Single-Electron Tunneling and Mesoscopic Devices

Part of the book series: Springer Series in Electronics and Photonics ((SSEP,volume 31))

Abstract

In this report we investigate the relation between a quantum fluctuation and junction parameters in small superconducting weak links with high normal resistance. Experimental results show that there exists a threshold resistance for the appearance of the Josephson effect in the weakly linked junctions.

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Author information

Authors and Affiliations

  1. Faculty of Engineering, Yokohama National University, Hodogaya, Yokohama, 240, Japan

    N. Yoshikawa, S. Furuoya, X. Chen & M. Sugahara

Authors
  1. N. Yoshikawa
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  2. S. Furuoya
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  3. X. Chen
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  4. M. Sugahara
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Editor information

Editors and Affiliations

  1. Physikalisch-Technische Bundesanstalt, Institut Berlin, Abbestrasse 2-12, W-1000, Berlin 10, Fed. Rep. of Germany

    Hans Koch  & Heinz Lübbig  & 

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© 1992 Springer-Verlag Berlin Heidelberg

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Yoshikawa, N., Furuoya, S., Chen, X., Sugahara, M. (1992). Quantum Fluctuation and Disappearance of the Josephson Effect in Highly Resistive Microbridges. In: Koch, H., Lübbig, H. (eds) Single-Electron Tunneling and Mesoscopic Devices. Springer Series in Electronics and Photonics, vol 31. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-77274-0_35

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  • DOI: https://doi.org/10.1007/978-3-642-77274-0_35

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-77276-4

  • Online ISBN: 978-3-642-77274-0

  • eBook Packages: Springer Book Archive

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