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Testability Design via Testability Measures

  • Tinghuai Chen

Abstract

Testability measures are used to describe the hardness (or easiness) of test generation for a logic circuit. In the analysis part we evaluate different definitions of testability from two requirements: precision and ease for computing. Postulates for an ideal definition are stated. In the synthesis part a technique for gate-level modification based on integer linear programming is proposed and experimental results are introduced. In order to reduce the number of variables, some approaches for testability measures at module-level are suggested.

Keywords

Boolean Function Test Generation Testability Measure Primary Input Primary Output 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1992

Authors and Affiliations

  • Tinghuai Chen
    • 1
  1. 1.Computer Research InstituteChongqing UniversityChongqingPR China

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