Testability Design via Testability Measures

  • Tinghuai Chen

Abstract

Testability measures are used to describe the hardness (or easiness) of test generation for a logic circuit. In the analysis part we evaluate different definitions of testability from two requirements: precision and ease for computing. Postulates for an ideal definition are stated. In the synthesis part a technique for gate-level modification based on integer linear programming is proposed and experimental results are introduced. In order to reduce the number of variables, some approaches for testability measures at module-level are suggested.

Keywords

Production Line Balas Mellon Compro 

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Copyright information

© Springer-Verlag Berlin Heidelberg 1992

Authors and Affiliations

  • Tinghuai Chen
    • 1
  1. 1.Computer Research InstituteChongqing UniversityChongqingPR China

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