Abstract
The Time-of-Flight Polarized Neutron Spectrometer (SPN-1) is installed at the IBR-2 reactor (JINR, Dubna). The possibility of using this instrument for the reflectometry of thin films is described. Some experiments performed in the reflectometry mode are reviewed.
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Korneev, D.A., Pasyuk, V.V., Petrenko, A.V., Dokukin, E.B. (1992). Neutron Reflectivity Studies on Superconducting, Magnetic and Absorbing Thin Films on the Polarized Neutron Spectrometer at the Pulsed Reactor IBR-2. In: Zabel, H., Robinson, I.K. (eds) Surface X-Ray and Neutron Scattering. Springer Proceedings in Physics, vol 61. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-77144-6_41
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DOI: https://doi.org/10.1007/978-3-642-77144-6_41
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