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A Structural Investigation of an Ultra-Thin Langmuir-Blodgett Film by an X-Ray Standing Wave Excited in a LSM Substrate Under the Bragg Diffraction Condition

  • M. V. Kovalchuk
  • S. I. Zheludeva
  • N. N. Novikova
  • I. V. Bashelhanov
  • M. J. Bedzyk
  • G. M. Bommarito
Part of the Springer Proceedings in Physics book series (SPPHY, volume 61)

Abstract

An organic multilayer on LSM substrate having the same period was investigated by XSW formed in LSM measuring the fluorescence from heavy atoms of Langmuir-Blodgett(L-B) film. The inclination of organic chains was determined and the interface between the film and LSM was shown to contain additional layer with thickness different for various parts of the sample.

Keywords

Heavy Atom Bragg Diffraction Total External Reflection Bragg Order Period Standing Wave 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1992

Authors and Affiliations

  • M. V. Kovalchuk
    • 1
  • S. I. Zheludeva
    • 1
  • N. N. Novikova
    • 1
  • I. V. Bashelhanov
    • 1
  • M. J. Bedzyk
    • 2
  • G. M. Bommarito
    • 3
  1. 1.A.V. Shubnikov Institute of CrystallographyUSSR Academy of SciencesMoscowUSSR
  2. 2.Cornell High Energy Synchrotron SourceCornell UniversityIthacaUSA
  3. 3.Department of ChemistryCornell UniversityIthacaUSA

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