Abstract
The results of specular and diffuse x-ray scattering studies of multilayers are discussed. We show here that such studies can yield detailed statistical information about the interfacial roughness and morphology. Results on a GaAs/AlAs multilayer are presented and the data is analyzed within the Born approximation.
On leave from: Solid State Physics Div., BARC, Bombay 400 085 India.
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References
S.K. Sinha, E.B. Sirota, S. Gasoff and H.B. Stanley, Phys. Rev. B38, 2297 (1988).
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S.K. Sinha, M.K. Sanyal, A. Gibaud, S.K. Satija, C.F. Majkrzak, and H. Homa, Proceedings of NATO Advanced Study Institute Conference in Crete, Greece, June 26–July 6, 1990.
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© 1992 Springer-Verlag Berlin Heidelberg
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Sanyal, M.K., Sinha, S.K., Gibaud, A., Satija, S.K., Majkrzak, C.F., Homa, H. (1992). Specular and Diffuse Scattering Studies of Multilayer Interfaces. In: Zabel, H., Robinson, I.K. (eds) Surface X-Ray and Neutron Scattering. Springer Proceedings in Physics, vol 61. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-77144-6_17
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DOI: https://doi.org/10.1007/978-3-642-77144-6_17
Publisher Name: Springer, Berlin, Heidelberg
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