Abstract
The growth mode of metal overlayers is of great scientific and technological Importance because it determines the final layer morphology upon which, in turn, some physical and chemical properties depend, among them electronic, magnetic and chemisorptive ones. The handling of such properties is of fundamental importance in microelectronics and catalysis.
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References
W. F. Egelhoff, Phys. Rev. B, 30, 1052 (1984)
W. F. Egelhoff, J. Vac. Sci. Technol., A 2, 350 (1984)
S. A. Chambers, T. R. Greenlee, C. P. Smith and J. H. Weaver, Phys. Rev. B, 32, 4245 (1985).
S. A. Chamber, S. B. Anderson and J. H. Weaver, Phys. Rev. B, 32, 4872 (1985).
S. A. Chambers, H. W. Chen, I. M. Vitomirov, S. B. Anderson and J. H. Weaver, Phys. Rev. B, 33, 8810 (1986).
S. A. Chambers and L. W. Swanson, Surface Sci. 131, 385 (1983)
C. S. Fadley, Progress Surf. Sci., 16, 275 (1984).
E. L. Bullock and C. S. Fadley, Phys. Rev. B, 31, 1212 (1985).
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© 1992 Springer-Verlag Berlin Heidelberg
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Heras, J.M., Asensio, M.C., Andreasen, G., Viscido, L. (1992). The Growth of Cobalt on Cu(100): An Angle Resolved Auger Electron Spectroscopy Study. In: Ponce, F.A., Cardona, M. (eds) Surface Science. Springer Proceedings in Physics, vol 62. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-76376-2_28
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DOI: https://doi.org/10.1007/978-3-642-76376-2_28
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-76378-6
Online ISBN: 978-3-642-76376-2
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