Abstract
The recent application of various methods of optical detection of electron paramagnetic resonance (ODEPR) and electron nuclear double resonance (ODENDOR) are reviewed and illustrated with examples from the study of III-V semiconductors.
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References
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© 1990 Springer-Verlag Berlin Heidelberg
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Spaeth, JM. (1990). ODMR of Defects in Semiconductors. In: Mehring, M., von Schütz, J.U., Wolf, H.C. (eds) 25th Congress Ampere on Magnetic Resonance and Related Phenomena. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-76072-3_8
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DOI: https://doi.org/10.1007/978-3-642-76072-3_8
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-53136-4
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