Abstract
The recent application of various methods of optical detection of electron paramagnetic resonance (ODEPR) and electron nuclear double resonance (ODENDOR) are reviewed and illustrated with examples from the study of III-V semiconductors.
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References
B.C. Cavenett, Adv. in Physics 30, 475 (1981).
M. Fockele, J.-M. Spaeth, E. Calleja, E. Munoz; to be published
F. J. Ahlers, F. Lohse, J.-M. Spaeth and L. F. Mollenauer: Phys. Rev. B 28, 1249 (1983)
A. Görger, B. K. Meyer, J.-M. Spaeth and A. Hennel; J. Phys. Semiconductor Science and Technology 3, 832 (1988)
M. Fockele, J.-M. Spaeth and P. Gibart; to be published
D. J. Chadi and K. J. Chang; Phys. Rev. Lett. 61, 873 (1988)
D. M. Hofmann, B. K. Meyer, F. Lohse and J.-M. Spaeth; Phys. Rev. Lett. 53, 1187 (1984)
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© 1990 Springer-Verlag Berlin Heidelberg
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Spaeth, JM. (1990). ODMR of Defects in Semiconductors. In: Mehring, M., von Schütz, J.U., Wolf, H.C. (eds) 25th Congress Ampere on Magnetic Resonance and Related Phenomena. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-76072-3_8
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DOI: https://doi.org/10.1007/978-3-642-76072-3_8
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-53136-4
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