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Theoretical Aspects of Scanning Tunneling Microscopy

  • J. Tersoff
Part of the Springer Series in Surface Sciences book series (SSSUR, volume 22)

Abstract

Since its invention by Binnig, Rohrer, and coworkers [14.1], scanning tunneling microscopy (STM) has established itself as a remarkable tool for studying surfaces. This chapter reviews the present theoretical understanding of STM, with emphasis on the interpretation of atomic-resolution STM images. The basic ideas and instrumentation have already been described in detail elsewhere [14.1].

Keywords

Scanning Tunneling Microscopy Scanning Tunneling Microscopy Image Small Voltage Tunneling Spectrum Effective Work Function 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1990

Authors and Affiliations

  • J. Tersoff
    • 1
  1. 1.IBM Research DivisionT.J. Watson Research CenterYorktown HeightsUSA

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