Abstract
Cubic SiC films were deposited on Si substrates by chemical vapor deposition (CVD) using a buffer layer at a normal pressure using Si2H6 and C2H2 as source materials at a substrate temperature of 1100 – 1350°C. The activation energy for SiC formation was 41.3 kcal/mole. A single crystal was obtained at 1250 °C. A new approach for low temperature growth was tried using HCl addition during the crystal growth. A single crystal of cubic SiC was obtained at a substrate temperature of 1150 °C without employing the buffer layer.
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© 1989 Springer-Verlag Berlin, Heidelberg
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Nishino, S., Saraie, J. (1989). Heteroepitaxial Growth of Cubic SiC on a Si Substrate Using the Si2H6-C2H2-H2 System. In: Rahman, M.M., Yang, C.YW., Harris, G.L. (eds) Amorphous and Crystalline Silicon Carbide II. Springer Proceedings in Physics, vol 43. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-75048-9_2
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DOI: https://doi.org/10.1007/978-3-642-75048-9_2
Publisher Name: Springer, Berlin, Heidelberg
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