Abstract
We review the history and the present impact of hot electron devices. We elaborate in particular on the tunnelling hot electron transfer amplifier (THETA) device. This device generates an almost monoenergetic, variable energy, hot electron beam (by tunnelling), which traverses a thin GaAs region to be eventually collected and energy analyzed. As the hot electrons traverse the device they are used to probe: scattering events, band nonparabolicity, size quantization effects, intervalley transfer, quantum mechanical reflections, and band discontinuities at interfaces.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
M. S. Shur, L. F. Eastman: IEEE Trans. Electron Devices 26, 1677 (1979)
J. J. Rosenberg, E. J. Yoffa, M. I. Nathan: IEEE Trans. Electron Devices 28, 941 (1981)
L. F. Eastman, R. Stall, D. Woodard, N. Dandekar, C. E. C. Wood, M. S. Shur, K. Board: Electron. Lett. 16, 525 (1980)
P. Hesto, J-F. Pone, R. Castagne: Appl. Phys. Lett. 40, 405 (1982)
D. J. Barterlink, J. L. Moll, N. I. Meyer: Phys. Rev. 130, 972 (1963)
J. R. Hayes, A. F. J. Levi, W. Wiegmann: Electron. Lett. 20, 851 (1984)
J. R. Hayes, A. F. J. Levi, W. Wiegmann: Phys. Rev. Lett. 54, 1570 (1985)
N. Yokoyama, K. Imamura, T. Ohshima, N. Nishi, S. Muto, K. Kondo, S. Hiyammzu: IEEE Digest IEDM, 532 (1984)
M. Heiblum, D. C. Thomas, C. M. Knoedler, M. I. Nathan: Appl. Phys. Lett. 47, 1105 (1985)
A. F. J. Levi, J. R. Hayes, P. M. Platzman, W. Wiegmann: Phys. Rev. Lett. 55, 2071 (1985)
M. Heiblum, M. I. Nathan, D. C. Thomas, C. M. Knoedler: Phys. Rev. Lett. 55, 2200 (1985)
M. Heiblum, I. M. Anderson, C. M. Knoedler: Appl. Phys. Leu. 49, 207 (1986)
U. K. Reddy, J. Chen, C. K. Peng H. Morkoç: Appl. Phys. Lett. 48, 1799 (1986)
J. S. Blakemore: J. Appl. Phys. 53, R123 (1982)
Marvin L. Cohen, T. R. Bergstresser: Phys. Rev. 141, 789 (1966). A slight modification was necessary: a pseudopotential parameter V s(G 2 = 11) = 0.055 was used instead of 0.06, in order to obtain a more realistic Γ to L energy split of 0.32 eV
T. Hiroshima, R. Lang: Appl. Phys. Lett. 49, 456 (1986)
J. H. Luttinger, W. Kohn: Phys. Rev. 97, 869 (1954)
M. A. Littejohn, J. R. Houser, T. W. Gilson: J. Appl. Phys. 48, 4587 (1977). Some of the reasons for the good empirical fits of the lower values of the commonly used nonparabolicity parameters to experimental data (such as the bulk plasma frequency vs. carrier concentration), are either the fact that second order corrections have been ignored even at high energies, or due to the incorrect use of the optical mass (Eq. (3b)). This mass includes an extra factor 2 in front of the parameter y, thus implying an under estimation of the nonparabolicity parameter.
C. A. Mead: Proc. IRE 48, 359 (1960)
M. Heiblum: Solid-St. Electron. 24, 343 (1981)
C. A. Mead: J. Appl. Phys. 32, 646 (1961)
J. P. Spratt, R. F. Schwarz, W. M. Kane: Phys. Rev. Lett. 6, 341 (1961)
R. N. Hall: Solid-St. Electron. 3, 320 (1961)
J. L. Moll: IEEE Trans. Electron Dev. 10, 299 (1963)
M. M. Atalla, R. W. Soshea: Solid-St. Electron. 6, 245 (1963)
M. Heiblum, S. Y. Wang, T. K. Gustafson J. R. Whinnery J: Quantum Electron. 14, 159 (1978)
D. V. Geppert: Proc. IRE 48, 1527 (1961)
D. Khang: Proc. IRE 50, 1534 (1961)
J. M. Levine, A. A. Iannini: Solid-St. Electron. 5, 109 (1962), and 273 (1962)
E. Rosencher, S. Delage, Y, Campidelli, F. A. D’Avitaya: Electron. Lett. 20, 764 (1984)
J. C. Hensel, A. F. J. Levi, R. T. Tung, J. M. Gibson: Appl. Phys. Lett. 47, 151 (1985)
C. O. Bozler, G. D. Alley, R. A. Murphy, D. C. Flanders, W. T. Lindley: IEEE Tech. Digest IEDM, 384 (1979)
J. M. Shannon: IEE J. Solid-St. Electron. Dev. 3, 142 (1979)
M. Heiblum: IBM Tech. Disclosure Magaz. 24, 4507 (1982)
J. M. Shannon A. Gill: Elect. Lett. 17, 621 (1981)
R. J. Malik, K. Board, L. F. Eastman, D. J. Woodard, C. E. C. Wood, T. R. AuCoin: Proc. Conf. Active Microwave Dev., Cornell Univ. 1981 (unpublished)
M. A. Hollis, S. C. Palmateer, L. F. Eastman, N. V. Dandeker, P. M. Smith: Electron. Dev. Lett. 4, 440 (1983)
J. M. Woodwock, J. J. Harris, J. M. Shannon: Physica 134B, 111 (1986)
I. Hase, H. Kawai, S. Imanaga, K. Kaneko, N. Watanabe: Electron. Lett. 21, 757 (1985)
N. Yokoyama, K. Imamura, S. Muto, S. Hiyamizu, H. Nishi, Jap: Appl. Phys. 24, L853 (1985)
A. P. Long, P. H. Beton, M. J. Kelly: Semicon. Sci. Tech. 1, 63 (1986)
U. K. Reddy, J. Chen, W. Kopp, C. K. Peng, D. Mui, H. Morin: IEEE Trans. Electron Device 33, 1865 (1986)
K. Imamura, S. Muto, T. Fujii, N. Yokoyama, S. Hiyamizu, A. Shibatomi: Electron. Lett. 22, 1148 (1986)
C. Y. Chang, Y. C. Liu, M. S. James, Y. H. Wang, S. Luryi, S. Sze: IEEE Electron. Dev. Lett. 7, 497 (1986)
S. Luryi: IEEE Electron. Dev. Lett. 5, 347 (1986)
P. M. Solomon: European Patent office Gazette, No. 92645, Filed 1983
K. Matsumoto, Y. Hayashi, N. Hashizumi, T. Yao, M. Kato, T. M. Ashita, N. Fukuhara, H. Hirashima, T. Kinosada: IEEE Electron Device Lett. 7, 627 (1986)
R. J. Malik, T. R. Aucoin, R. L. Ross, K. Board, C. E. C. Wood, F. Eastman: Electron. Lett. 16, 836 (1980)
D. Arnold, K. Hess: J. Appl. Phys. 61, 5178 (1987)
E. Decastro, P. Olivo: Phys. Status Solidi B132, 153 (1985)
P. Price: Superlattices and Microstructure 2, 213 (1986)
G. Krieger, R. Swanson: J. Appl. Phys. 52, 5710 (1981)
Z. A. Weinberg: J. Appl. Phys. 53, 5052 (1982)
Sadas Adachi: J. Appl. Phys. 46, 3932 (1985)
G. Lewicky, J. Maserjian: J. Appl. Phys. 46, 3032 (1975)
D. J. DiMaria, M. V. Fischetti, J. Batey, L. Dori, E. Tierney, J. Stasiak: Phys. Rev. Lett. 56, 3213 (1986)
T. W. Hickmott: Appl. Phys. Lett. 44, 90 (1984)
F. Capasso, S. Sen, A. Y. Cho, A.. L. Hutchinson: Appl. Phys. Lett., 50, 930 (1987)
M. Shur: Appl. Phys. Lett., 47, 869 (1985)
A. Chandra, L. F. Eastman: J. Appl. Phys. 51, 2669 (1980)
A. F. J. Levi, J. R. Hayes, P. M. Platzman, W. Weigman: Physica B134, 4801 (1985)
Frank Stern: Phys. Rev. Lett. 18, 546 (1967)
Alexander L. Fetter: Annals of Physics 81, 267 (1973); 88, 1 (1974)
David A. Dahl, L. J. Sham: Phys. Rev. B16, 651 (1977)
Eric D. Siggia, P. C. Kwok: Phys. Rev. B2, 1024 (1970)
J. Lin, I. C. Chiu: Appl. Phys. Lett. 49, 1802 (1986)
T. Ando, A. B. Fowler, Frank Stern: Rev. Mod. Phys. 54, 427 (1982)
Frank Stern: J. Computational Phys. 6, 56 (1970)
D. A. Aspnes: Phys. Rev. B14, 5331 (1976);
H. J. Lee, L. Y. Juravel, J. C. Wooley: Phys. Rev. B21, 659 (1980)
T. P. McLean: Progress in Physics, (Wiley, New York, 1960 ), Vol. 5, p. 55
E. M. Conwell: High Field Transport in Semiconductors, Academic Press, New York (1967)
K. Kash, P. A. Wolf, Bonner: Appl. Phys. Lett. 42, 173 (1983)
M. Heiblum, E. Calleja, I. M. Anderson, W. P. Dumke, C. M. Knoedler, L Osterling: Phys. Rev. Lett. 56, 2854 (1986)
I. Hase, H. Kawai, S. Imanaga, K. Kaneko, W. Watanabe: International Workshop on Future Electron Devices: Superlattice Devices, (Japan, 1987), Conference Procedings, p. 63
M. Chandrasekhar, F. H. Pollack: Phys. Rev. B15, 2127 (1977);
D. Olego, M. Cardona, and H. Müller, Phys. Rev. B22, 894 (1980)
M. Büttiker, R. Landauer: Phys. Rev. Lett. 49, 1739 (1982)
K. Seo, M. Heiblum, C. M. Knoedler, W-P. Hong, P. B. Bhattacharya: to be published
M. Heiblum, K. Seo, H. P. Meier, T. W. Hickmott: Phys. Rev. Lett. 60, 828 (1988)
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1990 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Heiblum, M., Fischetti, M.V. (1990). Ballistic Electron Transport in Hot Electron Transistors. In: Capasso, F. (eds) Physics of Quantum Electron Devices. Springer Series in Electronics and Photonics, vol 28. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-74751-9_9
Download citation
DOI: https://doi.org/10.1007/978-3-642-74751-9_9
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-74753-3
Online ISBN: 978-3-642-74751-9
eBook Packages: Springer Book Archive