Abstract
Our experience with surface structure determination by LEED intensity analysis has led us to the concept of complete surface structures. This concept is forced on us by the fact that a good fit to LEED data requires fixing all atom positions that deviate significantly from bulk positions. Hence many cases of deep structure, i.e., deviations extending several atomic layers below the top layer have been found. Especially studies of multilayer relaxation of open metallic surfaces1 have emphasized the need to specify many structural parameters, even on clean metallic crystals. In addition other experimental techniques have shown capability as deep probes, notably ion scattering2, and several theoretical approaches to relaxation in metals 3–6 have given insight into and consistent descriptions of multilayer relaxations which reinforce the experimental conclusions. Deep structure is also found in semiconductor surfaces, where the driving force is the formation of strained surface bonds, particularly angular strains, which in turn strain deeper layers to reduce the total strain energy7. Complete structure determinations on semiconductor surfaces have not been as successful as on metal surfaces, so we do not discuss semiconductors explicitly.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsPreview
Unable to display preview. Download preview PDF.
References
F. Jona and P. M. Marcus in Proceedings of the 2nd International Conference on Surface Structure, Amsterdam, ed. by J. van der Veen, (Springer 1988); containsa tabulation of all relaxation measurements as of early 1987)
J. F. van der Veen, Surface Sci. Rept. 5, 199 (1985); a review of ion scattering.
R. N. Barnett, U. Landman and C. L. Cleveland, Phys. Rev. Lett. 57, 1339 (1983)
R. N. Barnett, U. Landman and C. L. Cleveland, Phys. Rev. B27, 6534 (1983)
R. N. Barnett, U. Landman and C. L. Cleveland, Phys. Rev. B28, 1685 (1983).
K. M. Ho and K. P. Bohnen, Phys. Rev. B32, 3446 (1985)
A. Eguiluz, Phys. Rev. B35, 5473 (1987) (first-principles band calculations).
P. Jiang, P. M. Marcus and F. Jona, Solid State Commun. 59,275 (1986); see also refs. 1, 9, 18 (electrostatic model).
M. S. Daw and M. I Baskes, Phys. Rev. B29, 6443 (1984)
S. P. Chen, A. F. Voter and D. J. Srolovitz, Phys. Rev. Lett. 57,1308 (1986) (embedded atom method).
J. A. Appelbaum and D. R. Hamann, Surf. Sci. 74, 21 (1978).
J. Sokolov, F. Jona and P. M. Marcus, Solid State Commun. 49, 307 (1984); for more recent discussion of trends with openness see refs. 13 and 1.
P. M. Marcus, P. Jiang and F. Jona in Proceedings of the 2nd International Conference on Surface Structure, Amsterdam, ed. by J. van der Veen, (Springer 1988); discusses electrostatic models.
M. W. Finnis and V. Heine, J. Phys. F4, L37 (1974).
P. Jiang, F. Jona and P. M. Marcus, (submitted to Physical Review).
J. N. Andersen, H. B. Nielsen, L. Petersen and D. L. Adams, J. Phys C17, 173 (1984).
J. Sokolov, F. Jona and P. M. Marcus, Phys. Rev. B33, 1397 (1986).
J. Sokolov, H. D. Shih, U. Bondi, F. Jona and P. M. Marcus, J. Phys. C17, 371 (1984).
W. Moritz and D. Wolf, Surface Sci. 163, L655 (1985).
M. Copel and T. Gustafsson, Phys. Rev. Lett. 57, 723 (1986).
J. Sokolov, F. Jona and P. M. Marcus, Phys. Rev. B31, 1929 (1980).
P. Jiang, F. Jona and P. M. Marcus, Phys. Rev. B35, 7952 (1987).
. CRC Handbook of Chemistry and Physics, 67th ed., ed. Robert C. Weast, (CRC Press, Boca Raton, Florida, 1986–1987), pp.F-161, 162.
P. M. Marcus and F. Jona, Applications of Surface Sci. 11/12, 20 (1982).
J. B. Pendry, in Determination of Surface Structure by LEED, ed. P. M. Marcus and F. Jona, (Plenum Press, New York, 1984), pp. 1–15.
P. M. Marcus, F. Jona and M. Torrini, Proceedings of the International Seminar on Surface Structure Determination by LEED and Other Methods, Erlangen, W. Germany, 1986, pp. 60–63 (unpublished but available).
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1988 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Marcus, P.M., Jona, F. (1988). Complete Surface Structures. In: de Wette, F.W. (eds) Solvay Conference on Surface Science. Springer Series in Surface Sciences, vol 14. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-74218-7_6
Download citation
DOI: https://doi.org/10.1007/978-3-642-74218-7_6
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-74220-0
Online ISBN: 978-3-642-74218-7
eBook Packages: Springer Book Archive