Abstract
Structures of reconstructed surfaces and adsorbed layers are studied in-situ by UHV electron microscopy and diffraction. Transmission electron diffraction is useful for determining long range ordered structures such as Si(111)7×7 and also short range ordered structures using kinematical approximation. High-resolution electron microscopy at UHV can reveal local structures at atomic level resolution in transmission mode and at sub-nm resolution in reflection mode. Observations of the phase transition of Si(111) −7×7 to 1×1 and adsorption processes give finer information on structural details.
Keywords
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
K. Takayanagi: In “Proc. Asia Pasific Symposium on Surface Physics”, ed. by Xie Xide (World Scientific, Singapole (1987) p.23
Y. Tanishiro, K. Takayanagi, S. Takahashi, M. Takahashi and K. Yagi: In Proc. XI th Int. Cong. on Electron Microscopy, Kyoto, 1986 (Jpn. Soc. of Electron Microscopy, 1986)p.1340
K. Takayanagi: Jpn. J. Appl. Phys. 22, L4 (1983)
K. Yagi, K. Takayanagi and G. Honj O: In Crystals, ed. By H. E. Freyhardt, vol.7 (Springer-Verlag, Berlin 1982) p.47
L.D. Marks and D.J. Smith: Nature, 303, 316 (1983)
J.O. Bovin, Nature 317,417 (1985)
T. Hasegawa, K. Kobayashi, N. Ikarashi, K. Takayanagi and K. Yagi: Jpn. J. Appl. Phys., 25, L366 (1986)
K.Takayanagi, K.Kobayashi, K.Kodaira, Y.Yokoyama and K.Yagi: In Proc. 8th Int. Conf. in HVEM, (Berkeley,1983)p.47
K. Takayanagi, Y. Tanishiro, M. Takahashi and S. Takahashi: J. Vac. Sci. and Technol., A3, 1502 (1985)
K. Takayanagi, Y. Tanishiro, S. Takahashi and M. Takahashi: Surface Sci., 164, 367 (1985)
T. Ichikawa and S. Ino: Surface Sci., 136, 267 (1984)
H.J. Gossmann, J.C. Bean, L.C. Feldmann and W.H. Gibson: Surface Sci., 138, L175 (1984)
R.S. Becker, J.A. Golobchenko and B.S. Swartzentruber: Phys. Rev., B32, 8455 (1985)
K.Kaj iyama, K.Takayanagi, Y.Tanishiro and K.Yagi: In Proc. XIth Cong. on Electron Microscopy, Kyoto, 1986 (Jpn. Soc. Of Electron Microscopy,1986)p.1341
K. Takayanagi, Y. Tanishiro and K. Kajiyama: J. Vac Sci and Technol., B4, 1074 (1986)
K.Takayanagi: In Mat. Res. Soc. Sympo., ed. by J.M.Gibson, G.C.Osbourn and R.M.Tromp, vol.56(Materials Research Society, Pittsburgh,1986)p.129
T. Ishitsuka, K. Takayanagi, Y.Tanishiro and K.Yagi: In Proc. Xlth Int. Cong. Electron Microscopy, Kyoto, 1986(Jpn. Soc. of
Electron Microscopy,1986)p.1347
K. Takayanagi, Y. Tanishiro, K. Kobayashi, K. Akiyama and K. Yagi: Jpn. J. apple Phys., 26, L957 (1987)
Y. Tanishiro, K. Takayanagi and K. Yagi: J.Microscopy, 142, 211 (1986)
D. Haneman: Phys. Rev. Letters, 25, 1370 (1982)
R.S. Becker, L.A. Golovchenko, E.G. McRae, B.S. Swartzentruber: Phys. Rev. Letter, 55, 2028 (1985)
see references in [5]
Y.Tanishiro et ale: in preparation
Y. Tanishiro, K. Takayanagi and K. Yagi: Ultramicroscopy, 11, 95 (1983)
H. Jagodzinski, W. Morits and D. Wolf: Surface Sci., 77, 233 (1978)
S. Iijima and T. Ichihashi: Phys. Rev. Letters, 56, 616 (1986)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1988 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Takayanagi, K. (1988). Surface Structure Study by High-Resolution Electron Microscopy and Diffraction. In: de Wette, F.W. (eds) Solvay Conference on Surface Science. Springer Series in Surface Sciences, vol 14. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-74218-7_5
Download citation
DOI: https://doi.org/10.1007/978-3-642-74218-7_5
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-74220-0
Online ISBN: 978-3-642-74218-7
eBook Packages: Springer Book Archive