Abstract
Recent reports on the extent of secondary electron contributions in electron/photon stimulated desorption (ESD/PSD) appear to be contradictory. JAEGER et al. [1] suggested that secondary electrons provide the dominant contribution to the H+ yield from NH3/Ni and called the process x-ray induced ESD (XESD). Others have concluded that the XESD process is the dominant mechanism in the PSD of N+ and O+ ions from mixed condensed gases such as N2 and O2 [2] and in the PSD of H+ ions from OH/YbO-Sm [3]. On the other hand, considerable evidence exists in the literature for the dominance of the direct photon excitation mechanisms. This evidence usually comes from observed differences between the ion yield and the secondary electron yield or from the absence of any clear structure or “turn on” at certain core levels [4].
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References
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Ramaker, D.E., Madey, T.E., Kurtz, R.L., Sambe, H. (1988). The Magnitude of Secondary Electron Contributions in Photon Stimulated Desorption. In: Stulen, R.H., Knotek, M.L. (eds) Desorption Induced by Electronic Transitions DIET III. Springer Series in Surface Sciences , vol 13. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-73728-2_24
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DOI: https://doi.org/10.1007/978-3-642-73728-2_24
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