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Radiation Enhanced Diffusion (RED) in a Sputtered Ag/Ni Layered System

  • D. Marton
  • J. Fine
  • G. P. Chambers
Conference paper
Part of the Springer Series in Surface Sciences book series (SSSUR, volume 12)

Abstract

The layered Ag/Ni system has been shown to exhibit surface segregation of Ag when an Ag layer buried between two Ni layers is sputter profiled at room temperature [1]. While that study was directed to the analysis of radiation induced segregation (RIS), it showed also the role of diffusion in the transport of Ag atoms to the surface. The segregation rate was shown to obey first order kinetic equations, and segregation rates for 1 keV and 4 keV sputtering were determined.

Keywords

Depth Profile Segregation Rate Interface Width Order Kinetic Equation Auger Depth Profile 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1988

Authors and Affiliations

  • D. Marton
    • 1
  • J. Fine
    • 1
  • G. P. Chambers
    • 1
  1. 1.Surface Science DivisonNational Bureau of StandardsGaithersburgUSA

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