Radiation Enhanced Diffusion (RED) in a Sputtered Ag/Ni Layered System
The layered Ag/Ni system has been shown to exhibit surface segregation of Ag when an Ag layer buried between two Ni layers is sputter profiled at room temperature . While that study was directed to the analysis of radiation induced segregation (RIS), it showed also the role of diffusion in the transport of Ag atoms to the surface. The segregation rate was shown to obey first order kinetic equations, and segregation rates for 1 keV and 4 keV sputtering were determined.
KeywordsDepth Profile Segregation Rate Interface Width Order Kinetic Equation Auger Depth Profile
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