Surface Structure of Metallic Glasses Studied by Scanning Tunneling Microscopy
The scanning tunneling microscope (STM) is already well known for imaging topographic and electronic features of surfaces of a great variety of conducting samples with high vertical and lateral resolution as well as for local surface modifications which can be performed under special experimental conditions /l, 2/.
KeywordsBarrier Height Metallic Glass Scanning Tunneling Microscope Tunneling Current Topographic Image
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- 1.IBM J. Res. &Dev., Vol. 30, No.4+5, (1986)Google Scholar
- 2.Proc. 1st Int. Conf. STM ’86, ed. by N. Garcia (North Holland, Amsterdam 1987)Google Scholar
- 4.R. Wiesendanger, L. Eng, H.R. Hidber, P. Oelhafen, L. Rosenthaler, U. Staufer, H. -J. Güntherodt: Proc. ECOSS 9 (to be published in Surf. ScL )Google Scholar
- 5.M. von Allmen: In Glassy Metals II, ed. by H. Beck and H. -J. Güntherodt, Springer Topics in Appl.Phys. (Springer, Berlin, Heidelberg 1983), p.261Google Scholar
- 7.F. Flores, P.M. Echenique, R.H. Ritchie: Phys.Rev. B34, 2899, (1986)Google Scholar
- 8.U. Staufer, R. Wiesendanger, L. Eng, L. Rosenthaler, H.R. Hidber, H.-J. Güntherodt: Appl.Phys.Lett. (to be published in July 1987)Google Scholar