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RHEED Intensity Analysis on a Single Domain Si(100)-2 × 1

  • T. Kawamura
  • N. Takahashi
  • T. Sakamoto
  • K. Sakamoto
  • G. Hashiguchi
Part of the Springer Series in Surface Sciences book series (SSSUR, volume 11)

Abstract

The clean Si(100) shows a (2×1) reconstructed structure, which has been studied in recent years by LEED[1], scanning tunneling microscopy (STM)[2], RHEED[3] and so on. On the reconstructed structure, there are several proposed models. Among these models, the dimer models appear to explain most of the experimental results. For instance, Tromp et al. [2] have shown arrays of dimers with some vacancies in their STM image, which favors the dimer model. There are several versions of dimer model. One is a symmetric dimer model proposed by Applebaum and Hamann [4]. An asymmetric dimer model by Chadi [5] was derived from energy minimization calculation. Another is a twisted dimer model which was proposed to explain LEED intensity curves as a function of the incident beam energy by Jona et al.[1]. There are other modified models as well.

Keywords

Scanning Tunneling Microscopy Single Domain Scanning Tunneling Microscopy Image Reliability Factor Incident Electron Energy 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1988

Authors and Affiliations

  • T. Kawamura
    • 1
  • N. Takahashi
    • 1
  • T. Sakamoto
    • 2
  • K. Sakamoto
    • 2
  • G. Hashiguchi
    • 2
  1. 1.Department of PhysicsYamanashi UniversityKofu, Yamanashi 400Japan
  2. 2.Electrotechnical LaboratoryNiihari-gun, Ibaraki 305Japan

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