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Surface Structure Analysis by Scanning LEED Microscopy

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The Structure of Surfaces II

Part of the book series: Springer Series in ((SSSUR,volume 11))

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Abstract

The use of Low Energy Electron Diffraction (LEED) has so far been limited to the study of relatively large single crystal surfaces. Here we discuss how LEED can be utilized as a microanalytical tool which has a wide range of application to “real world” samples. A few of the capabilities of Scanning LEED Microscopy are demonstrated with the following examples: the step structure of the clean Si(111) surface, the domain structure of the reconstructed Si(110)16×2 surface and surface imperfections of GaAs(100) single crystal.

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Author information

Authors and Affiliations

  1. Department of Applied Physics, Waseda University, 3-4-1, Ohkubo, Shinjuku-ku, Tokyo 160, Japan

    T. Ichinokawa, Y. Ishikawa, Y. Hosokawa & J. Hamaguchi

  2. Institut für Grenzflächenforschung und Vakuumphysik, Kernforschungsanlage Jülich, D-5170, Jülich, Fed. Rep. of Germany

    J. Kirschner

Authors
  1. T. Ichinokawa
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  2. Y. Ishikawa
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  3. Y. Hosokawa
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  4. J. Hamaguchi
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  5. J. Kirschner
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Editor information

Editors and Affiliations

  1. FOM-Institute for Atomic and Molecular Physics, Kruislaan 407, NL-1098 SJ, Amsterdam, The Netherlands

    Johannes Friso van der Veen

  2. Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, Berkeley, CA, 94720, USA

    Michel A. Van Hove

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© 1988 Springer-Verlag Berlin Heidelberg

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Ichinokawa, T., Ishikawa, Y., Hosokawa, Y., Hamaguchi, J., Kirschner, J. (1988). Surface Structure Analysis by Scanning LEED Microscopy. In: van der Veen, J.F., Van Hove, M.A. (eds) The Structure of Surfaces II. Springer Series in Surface Sciences , vol 11. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-73343-7_11

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  • DOI: https://doi.org/10.1007/978-3-642-73343-7_11

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-73345-1

  • Online ISBN: 978-3-642-73343-7

  • eBook Packages: Springer Book Archive

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