Abstract
The electron microscope is, by essence, ideally suited to the study of localised microstructures such as interfaces. Formally, this is because the phase information of the electron waves scattered by the specimen is maintained in the formation of the image (e.g. see /l/).
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Principles of Optics, M. Born and E. Wolf, Pergamon Press (1975).
Electron Microscopy of Thin Crystals, P. B. Hirsch, A. Howie, R. B. Nicholson, D. W. Pashley and M. J. Whelan, R. E. Krieger (New York, 1977).
Experimental High Resolution Electron Microscopy, J. C. H. Spence, Clarendon Press (Oxford, 1981).
Introduction to Analytical Electron Microscopy, J. J. Hren, J. I. Goldstein and D. C. Joy, Plenum Press (New York, 1979).
J. L. Hutchison Ultramicroscopy 15 51 (1984). Ultramicroscopy 18 349 (1985)
C. J. Humphreys p.105 of Electron Microscopy 1986, ed T. Imura, S. Maruse and T. Suzuki, pub. Jap. Soc. Electron Microscopy (Tokyo,1986)
Microscopy of Semiconducting Materials 1983, Conference Series N° 67 pub. I.o.P. (London, 1983)
Microscopy of Semiconducting Materials 1985, conference Series N° 76 pub. I.o.P. (London, 1985).
Microscopy of Semiconducting Materials 1987, to be published.
M. S. Abrahams and C. J. Buiocchi. Appi.Phys.Lett. 27 235 (1975).
M. Dupuy J.Microsc.Spectrosc.Electron. 9 163 I984)
H. Ichinose, T. Furuta, H. Sakaki and Y. Ishida, p.1485 of Electron Microscopy 1986 ed. T. Imura, S. Maruse and T. Suzuki, pub. Jap.Soc. Electron Microscopy (Tokyo,1986)
N. Tanaka and K. Mihama, p.1493 of Electron Microscopy 1986 (see ref /12/).
H. Ichinose, T. Furuta, H. Sakaki and Y. Ishida, p.1483 of Electron Microscopy 1986 (see ref. /12/).
B. C. de Cooman, N. - H. Cho, Z. Elgat and C. B. Carter U1tramicroscopy 18 305 (1985).
H. Kakibayashi and F. Nagata Jap.J.Appi.Phys. 25 1644 (1986).
C. W. T. Bulle-Lieuwma, P. C. Zalm and M. P. A. Viegers, p.123 of ref./8/.
D. Cherns, G. R. Anstis, J. L. Hutchison, and J. C. H. Spence, Phil.Mag. A46 849 (1982).
D. Cherns, C. J. D. Hetherington and C. J. Humphreys, Phil.Mag. A49 165 (1984).
J. M. Gibson, Ultramicroscopy 14 1 (1984).
J. L. Hutchison, G. R. Booker and M. S. Abrahams, p.139 of Inst.Phys.Conf.Series N°61 I.o.P. (London, 1981).
F. A. Ponce Appi.Phys.Lett. 41 371 (1982).
D. J. Smith, L. A. Freeman, R. A. McMahon, H. Ahmed, M. G. Pitt and T. B. Peters, p.83 of ref. /7/ (1983).
O. L. Krivanek and J. H. Mazur Appi.Phys.Lett. 37 392 (1980).
C. d’Anterroches, J.Microsc.Spectrosc.Electron. 9 147 (1984).
S. M. Goodnick, D. K. Ferry, C. W. Wilmsen, Z. Lilienthal, D. Fathy and O. L. Krivanek, Phys.Rev. B 32 8171 (1985).
O. L. Krivanek and S. L. Fortner Ultramicroscopy 14 121 (1984)
P. Ruterana, J - P. Chevalier, P. Friedel and N. Bonnet to be published in ref./9/.
Z. Lilienthal, O. L. Krivanek, J. F. Wagner and S. M. Goodnick Appi.Phys.Lett. 46 889 (1985).
P. Ruterana, P. Friedel, J. Schneider and J - P. Chevalier, Appl.Phys.Lett. 49 672 (1986).
O. L. Krivanek and Z. Lilienthal, Ultramicroscopy 18 355 (1985).
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1987 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Chevalier, JP. (1987). On the Use of Electron Microscopy in the Study of Semiconductor Interfaces. In: Le Lay, G., Derrien, J., Boccara, N. (eds) Semiconductor Interfaces. Springer Proceedings in Physics, vol 22. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-72967-6_9
Download citation
DOI: https://doi.org/10.1007/978-3-642-72967-6_9
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-72969-0
Online ISBN: 978-3-642-72967-6
eBook Packages: Springer Book Archive