Monolayer Sensitive X-Ray Diffraction Techniques: A Short Guided Tour Through the Literature

  • M. Sauvage-Simkin
Conference paper
Part of the Springer Proceedings in Physics book series (SPPHY, volume 22)


The advent of powerful X-ray sources, rotating anode X-ray generators and Synchrotron Radiation sources, has made possible the detection of X-ray diffraction signals or of secondary effects excited by diffracted X-rays, produced in atom monolayers.

Such methods have found numerous applications in the characterization of semiconductor surfaces and interfaces and can be classified in two main groups: surface or superficial layer scattering collected in a grazing incidence geometry, with application to the determination of the atomic structure in surface unit cell, the second group is concerned with the excitation of surface or interface atoms by Bragg diffraction-induced X-ray standing waves.


Critical Incidence Synchrotron Radiation Source Interface Atom Surface Unit Cell Surface Phase Transition 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


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Copyright information

© Springer-Verlag Berlin Heidelberg 1987

Authors and Affiliations

  • M. Sauvage-Simkin
    • 1
    • 2
  1. 1.LURECNRS-MEN-CEAOrsayFrance
  2. 2.Laboratoire de Minéralogie-CristallographieUniversités Pierre et Marie Curie et Paris VII, Associé au CNRSParis CedexFrance

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