Monolayer Sensitive X-Ray Diffraction Techniques: A Short Guided Tour Through the Literature

  • M. Sauvage-Simkin
Conference paper
Part of the Springer Proceedings in Physics book series (SPPHY, volume 22)

Abstract

The advent of powerful X-ray sources, rotating anode X-ray generators and Synchrotron Radiation sources, has made possible the detection of X-ray diffraction signals or of secondary effects excited by diffracted X-rays, produced in atom monolayers.

Such methods have found numerous applications in the characterization of semiconductor surfaces and interfaces and can be classified in two main groups: surface or superficial layer scattering collected in a grazing incidence geometry, with application to the determination of the atomic structure in surface unit cell, the second group is concerned with the excitation of surface or interface atoms by Bragg diffraction-induced X-ray standing waves.

Keywords

Refraction Auger GaSb 

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References

  1. 1.
    I. K. Robinson “Surface Crystallography” in Handbook on Synchrotron Radiation. Ed. D.E. Moncton and G. Brown, North-Holland 1987Google Scholar
  2. 2.
    P.A. Fuoss, K.S. Liang and P. Eisenberger. “Advances in Surfaces and Low-dimensional Systems” in Synchrotron Radiation Research. Ed. R. Z. Bachrach - Plenum (1987)Google Scholar
  3. 3.
    I.K. Robinson, W.K. Waskiewiz, P.A. Fuoss, J.B. Stark, P.A. Bennet. Phys. Rev., B33 (1986) 7013ADSGoogle Scholar
  4. 4.
    I.K. Robinson, Phys. Rev., B35 (1987) in pressGoogle Scholar
  5. 5.
    I.K. Robinson, W.K. Waskiewicz, R.T. Tung and J. Bohr, Phys. Rev. Lett., 57 (1986) 2714ADSCrossRefGoogle Scholar
  6. 6.
    F. Grey, Internal Report-Aarhus University (1987)Google Scholar
  7. 7.
    J. Bohr, R. Feidenhans’l, M. Nielsen, M. Toney, R.L. Johnson and I.K.Robinson, Phys. Rev. Lett., 54 (1985) 1275ADSCrossRefGoogle Scholar
  8. 8.
    R. Feidenhans’1, J. Bohr, H. Nielsen,M. Toney, R.L. Johnson, F. Grey and I.K. Robinson, Festkörperprobleme XXV 545 (1985)Google Scholar
  9. 9.
    R. Feidenhans’1, P.H.D. Thesis “Solving Surface Structure with X-ray Diffraction” Aarhus University, Denmark 1986Google Scholar
  10. 10.
    R. Feidenhans’l, M. Nielsen, F. Grey, R. L. Johnson and I. K. Robinson (1987), to be publishedGoogle Scholar
  11. 11.
    I.K. Robinson, Phys. Rev., §33 (1986) 3830CrossRefGoogle Scholar
  12. 12.
    I. K. Robinson in “Structure of Surfaces” Ed. H.A. Van Hove and S.Y. Tong, Springer-Verlag (1985)Google Scholar
  13. 13.
    R. Feidenhans’l, J.S. Pedersen, M. Nielsen, F. Grey and R.L. Johnson, Surf. Science, 178 (1986) 927ADSCrossRefGoogle Scholar
  14. 14.
    H.J. Gossmann, J.C. Bean, L.C. Feldman, E.G. Macrae and I.K. Robinson, Phys. Rev. Lett. (1985)Google Scholar
  15. 15.
    J.C. Bean, L.C. Feldman, A.T. Fiovy, S. Nakahara and J.K. Robinson, J. Vac. Sc. Technol., A2 (1984) 436Google Scholar
  16. 16.
    W.C. Marra, P. Eisenberger and A.Y. Cho, J. Appl. Phys., 50 (1979) 6927ADSCrossRefGoogle Scholar
  17. 17.
    P.H. Fuoss and I.K. Robinson, Nucl. Inst. Meth., 222 (1984) 171CrossRefGoogle Scholar
  18. 18.
    S. Brennan and P. Eisenberger, Nucl. Inst. Meth., 222 (1984) 164CrossRefGoogle Scholar
  19. 19.
    P. Claverie, Thèse de Docteur-ingénieur, Université de Clermont (1986)Google Scholar
  20. 20.
    E. Vlieg, A. Van’ t Ent, A.P. De Jongh and J.F. Van der Veen (1987) to be publishedGoogle Scholar
  21. 21.
    G.H. Vineyard, Phys. Rev., B26 (1982) 4146ADSGoogle Scholar
  22. 22.
    P.L. Cowan, Phys. Rev., B32 (1985) 5437ADSGoogle Scholar
  23. 23.
    A.M. Afanas’ev and M.K. Melkonyan, Acta Cryst., A29 (1983) 207Google Scholar
  24. 24.
    P.L. Cowan S. Brennan, T. Jach, M.J. Bedzyk and G. Materlik, Phys. Rev. Lett., 57 (1986) 2399ADSCrossRefGoogle Scholar
  25. 25.
    A.L. Golovin, R.M. Imamov and S.A. Stepanov, Acta. Cryst., A40 (1984) 225Google Scholar
  26. 26.
    M.J. Bedzyk and G. Materlik, Phys. Rev., B32 (1985) 6456ADSGoogle Scholar
  27. 27.
    A. Authier, Acta Cryst., A42 (1986) 414Google Scholar
  28. 28.
    S. Kjaer Andersen, J.A. Golovchenko and G. Mair, Phys. Rev. Lett., 37 (1976) 1141ADSCrossRefGoogle Scholar
  29. 29.
    N. Hertel, G. Materlik and J. Zegenhagen, Z. Phys., B58 (1985)Google Scholar
  30. 30.
    J.A. Golovchenko, J.R. Patel, D.R. Kaplan, P.L. Cowan and M.J. Bedzyk, Phys. Rev. Lett., 49 (1982) 560ADSCrossRefGoogle Scholar
  31. 31.
    M.J. Bedzyk and G. Materlik, Phys. Rev., B31 (1985) 4110ADSGoogle Scholar
  32. 32.
    E. Vlieg, A.E.M.J. Fischer, J.F. Van der Veen, B.N. Dev and G. Materlik, Surface Science, 178 (1986)Google Scholar
  33. 33.
    B.N. Dev, G. Materlik, F. Grey, R.L. Johnson and M. Clausnitzer, Phys. Rev. Lett., 57 (1986) 3058ADSCrossRefGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1987

Authors and Affiliations

  • M. Sauvage-Simkin
    • 1
    • 2
  1. 1.LURECNRS-MEN-CEAOrsayFrance
  2. 2.Laboratoire de Minéralogie-CristallographieUniversités Pierre et Marie Curie et Paris VII, Associé au CNRSParis CedexFrance

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