Abstract
We have inverstigated the dynamics of photoexcited carriers in InGaAs/GaAs quantum wells using the photoluminescence up-conversion technique. In this study we describe the observation of an extremely fast (600fs) capture process in shallow InGaAs/GaAs quantum wells, resulting from resonant tunnelling from impurities in the GaAs barrier.
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References
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Dao, L.V., Gal, M., Tan, H.H., Jagadish, C. (1998). Ultrafast Carrier Capture into InGaAs/GaAs Quantum Wells. In: Ultrafast Phenomena XI. Springer Series in Chemical Physics, vol 63. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-72289-9_90
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DOI: https://doi.org/10.1007/978-3-642-72289-9_90
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