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Ultrafast Phenomena XI pp 109–111Cite as

Pulse Characterization Techniques for sub-30 Femtosecond Terawatt Lasers

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Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 63))

Abstract

Single-shot characterization of spectral phase, pulse duration, and spectrum of femtosecond, terawatt pulses is described, using a specially designed, low-dispersion polarization-gate frequency-resolved optical gating arrangement.

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References

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Author information

Authors and Affiliations

  1. Institute for Nonlinear Science, University of California at San Diego, 9500 Gilman Dr., La Jolla, CA, 92093-0339, USA

    Csaba Tóth, David N. Fittinghoff & Christopher P. J. Barty

  2. Department of Chemistry and Biochemistry, USA

    Barry C. Walker

  3. Department of Electrical and Computer Engineering, USA

    Jeff A. Squier

Authors
  1. Csaba Tóth
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  2. David N. Fittinghoff
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  3. Barry C. Walker
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  4. Jeff A. Squier
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  5. Christopher P. J. Barty
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© 1998 Springer-Verlag Berlin Heidelberg

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Cite this paper

Tóth, C., Fittinghoff, D.N., Walker, B.C., Squier, J.A., Barty, C.P.J. (1998). Pulse Characterization Techniques for sub-30 Femtosecond Terawatt Lasers. In: Ultrafast Phenomena XI. Springer Series in Chemical Physics, vol 63. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-72289-9_33

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  • DOI: https://doi.org/10.1007/978-3-642-72289-9_33

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-72291-2

  • Online ISBN: 978-3-642-72289-9

  • eBook Packages: Springer Book Archive

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