Abstract
In order to measure the spectral brilliance of laser plasma X-ray sources, a spectrograph has been developed which allows simultaneous recording of the wavelength depending source diameter and the source spectrum. The optical system is a new single element X-ray optic [7], which produces a series of lateral displaced enlarged images of the X-ray source at different wavelength on the detector, a cooled slow scan CCD camera with a thinned, back illuminated CCD. First brilliance measurements of different laser plasma sources in the wavelength range λ=1.5... 5nm have been performed, showing that laser plasma sources can serve as bright laboratory X-ray sources for applications in the soft X-ray region.
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Wilhein, T. (1998). Investigations on Laser-Generated Plasma Sources. In: Thieme, J., Schmahl, G., Rudolph, D., Umbach, E. (eds) X-Ray Microscopy and Spectromicroscopy. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-72106-9_38
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DOI: https://doi.org/10.1007/978-3-642-72106-9_38
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