Investigations on Laser-Generated Plasma Sources

  • T. Wilhein


In order to measure the spectral brilliance of laser plasma X-ray sources, a spectrograph has been developed which allows simultaneous recording of the wavelength depending source diameter and the source spectrum. The optical system is a new single element X-ray optic [7], which produces a series of lateral displaced enlarged images of the X-ray source at different wavelength on the detector, a cooled slow scan CCD camera with a thinned, back illuminated CCD. First brilliance measurements of different laser plasma sources in the wavelength range λ=1.5... 5nm have been performed, showing that laser plasma sources can serve as bright laboratory X-ray sources for applications in the soft X-ray region.


Boron Nitride Plasma Source Laser Plasma Source Size Brilliance Measurement 
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  1. 1.
    See, e.g., G. Schmahl, D. Rudolph, B. Niemann, P. Guttmann, J. Thieme, G. Schneider, Naturwissenschaften 83 (1996), 61.ADSCrossRefGoogle Scholar
  2. 1a.
    F. J. Wuilleumier, Y. Petroff, and I. Nenner, eds., Vacuum Ultraviolet Radiation Physics, Proc. of the 10th VUV conference (World Scientifc, Singapore, 1993).Google Scholar
  3. 2.
    E.-E. Koch, D. E. Eastman, and Y. Farge, Handbook on Synchrotron Radiation (North Holland, Amsterdam, 1983).Google Scholar
  4. 3.
    M. C. Richardson, G. A. Kyrala, eds. Applications of Laser Plasma Radiation II, Proc. SPIE Vol. 2523 (1995).Google Scholar
  5. 4.
    C. Tillmann, A. Persson, C.-G. Wahlström, S. Svanberg, K. Herrlin, Appl. Phys. B 61, 333 (1995).ADSCrossRefGoogle Scholar
  6. 5.
    A. G. Michette and C. J. Buckley, eds. X-Ray Science and Technology, (Institute of Physics, Bristol, 1993).Google Scholar
  7. 6.
    T. Schliebe, Diffraktive Kondensoroptiken für die Röntgenmikroskopie, Elektronenstrahllithographie und Nanostrukturierung, PhD-thesis, (Göttingen, in preparation).Google Scholar
  8. 7.
    B. Niemann, T. Wilhein, T. Schliebe, R. Plontke, O. Fortagne, I. Stolberg, M. Zierbock, Microelectr. Eng. 30, 49 (1996).CrossRefGoogle Scholar
  9. 8.
    B. Niemann, New X-ray optical elements generated by the electron beam lithography system LION LVI, this volume.Google Scholar
  10. 9.
    T. Wilhein, D. Rothweiler, A. Tusche, F. Scholze, and W. Meyer-Ilse, in X-ray Microscopy IV, V.V. Aristov and A.I. Erko, eds. (Bogorodskii Pechatnik Publishers, Chernogolovka, Moscow region, 1994) p. 470.Google Scholar
  11. 10.
    T. Wilhein, D. Hambach, B. Niemann, M. Berglund, L. Rymell, H. M. Hertz, Appl. Phys. Lett. 71 (28), (1997).Google Scholar
  12. 11.
    L. Rymell and H. M. Hertz, Opt. Commun. 103, 105 (1993).ADSCrossRefGoogle Scholar
  13. 12.
    L. Rymell, M. Berglund and H. M. Hertz, Appl. Phys. Lett. 66, 2625 (1995).ADSCrossRefGoogle Scholar
  14. 13.
    M. Berglund, L. Rymell, and H. M. Hertz, Appl. Phys. Lett. 69, 1683 (1996).ADSCrossRefGoogle Scholar
  15. 14.
    U. Teubner, C. Wülker, W. Theobald, E. Förster, Phys. Plasmas 2, 972 (1995);ADSCrossRefGoogle Scholar
  16. 14a.
    U. Teubner, W. Theobald, C. Wülker, J. Phys. B 29 (1996) 4333.ADSGoogle Scholar
  17. 14b.
    S. Szatmari, F. P. Schäfer, Opt. Comm. 68, 196 (1988).ADSCrossRefGoogle Scholar
  18. 15.
    T. Wilhein, R. Häßner, D. Altenbernd, U. Teubner, W. Theobald, E. Förster, R. Sauerbrey, X-ray brilliance measurements of a sub picosecond laser-plasma using an elliptical off-axis reflection zone plate, subm. to Opt. Lett.Google Scholar
  19. 16.
    T. Wilhein, G. Schriever, S. Mager, K. Gäbel, R. Lebert, to be published.Google Scholar
  20. 17.
    R. Lebert, G. Schriever, S. Mager, A. Naweed, O. Treichel, K. Bergmann, W. Neff, Laser Produced and Pinch Plasmas: Narrowband X-Ray sources for Applications. X-Tech 96 Workshop, Berlin, Sept. 29–Oct. 2, 1996.Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1998

Authors and Affiliations

  • T. Wilhein
    • 1
  1. 1.Forschungseinrichtung RöntgenphysikGeorg-August-Universität GöttingenGöttingenGermany

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