Abstract
The possibility of obtaining not only a magnified image of the object but also its diffraction pattern is the main advantage of an electron microscope. It is also essential that both the electron microscopic image and the diffraction pattern correspond to the same part of the specimen studied. With V= 100 kV, the dimensions of the object analyzed may be as small as several thousands of Å, and even several hundreds of Å under special conditions.
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© 1987 Springer-Verlag Berlin Heidelberg
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Drits, V.A. (1987). Geometrical Analysis of Point Electron-Diffraction Patterns. In: Electron Diffraction and High-Resolution Electron Microscopy of Mineral Structures. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-71729-1_4
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DOI: https://doi.org/10.1007/978-3-642-71729-1_4
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-71731-4
Online ISBN: 978-3-642-71729-1
eBook Packages: Springer Book Archive