Abstract
This paper contains comments on present day limits to microlithography. The methods discussed are those used to fabricate semiconductor integrated circuits, but the same methods are also used to fabricate integrated optical devices, thin film displays and a variety of other devices of commercial and scientific interest.
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References
A.N. Broers: InMaterials for Microiithoqraphy, ed. by L.Thompson etal., (Am. Chem. Soc., Washington, D.C. 1 984) p.11, and A.N.Broers and T.H.P Chang: InMicrocircuit Engineering 78, ed. by H. Ahmed and W.C.Nixon, ( Cambridge University Press 1978 ), p. 1
Microcircuit Engineering 83, ed. by H. Ahmed, J.R.A. Cleaver and G.A.C. Jones (Academic Press, London 1983);Microcircuit Engineering 84, ed. by A.Heuberger and H.Beneking (Acadamic Press, London, 1985);Microcircuit Engineering 85, ed. by K. D. van der Mast and S.Radelaar (North Holland, Amsterdam, 1 985)
D.L. Spears and H.I. Smith: ELectron. Lett. 8, p.102, (1972)
A.E. Gruen : Z. Naturforsch, 12a, p.89, (1957)
E. Spiller and R. Feder:. In H.JQuesser X-Ray Optics, (Springer, Berlin 1977)
A. Heuberger: Solid State Technology, February, (1986)
H. Bohlen: IBM J. Res. Dev.26, p.568, (1 982)
R.L. Seliger etal.: J. Vac. Sci. Technol.,16, p. 1 610, (1979)
D. Markle: Solid State Technology, September, (1984)
H.C. Pfeiffer: IEEE Trans. Electron. Dev.ED-26, p. 663, (1979)
A.N. Broers and P. Coane: to be published Appl. Phys. Lett. (1986)
M.A. Sturans and H.C. Pfeiffer: InMicrocircuit Engineering 84, ed. by A. Heuberger and H. Beneking ( Academic Press, London 1984 ), p. 107
K.D. Van der Mast, G.H. Jansen and J.E. Barth: InMicrocircuit Engineering 85, ( North Holland, Amsterdam 1985 ), p. 43
T.E. Everhart: InMaterials in Microlithography, ed. by L.F.Thompson etal., ( Am. Chem. Soc. Washington, D.C. 1984 ) p. 5
T.H.P. Chang: J. Vac. Sci. Technol.12, p. 1 27, (1975)
A.N. Broers: J. Electrochem. Soc.,128, p. 166, (1980)
T.O. Sedgwick, A.N. Broers and B.J. Agule: J. Electrochem. Soc.,119, p. 1 769, (1972)
A.N. Broers, J.J. Cuomo, J. Harper, W. Molzen, R. Laibowitz, M. Pomerantz:Electron Microscopy 1978, Vol. Ill, ed. by J.M. Sturgess, (Microscopical Soc. of Canada, Toronto 1978) p. 343–354, and A.N. Broers, J.J. Cuomo and W. Krakow:IBM Technical Disclosure Bulletin, 24, p.1534, (1981)
M. Isaacson and A. Muray: J. Vac. Sci. Technol.,19, p. 1117, (1981)
M.E.Mochel, C.J.Humphreys, J.M.Mochel and J.A.Eades: Proc. 41st Annual Meeting of the Electron Microscopy Soc. of America, (San Francisco Press 1983), p.100
A.F.Mayadas and R.B.Laibowitz: Phys. Rev. Lett.,28 p. 156, (1972)
W.S.Mackie, W.Patrick, S.P.Beaumont and C.D.W.Wilkinson:Microcircuit Engineering 84, ( Academic Press, London 1985 ), p. 213
R.E.Howard, L.D.Jackel and W.J.Skocpol: Microcircuit Engineering 85 (North Holland, Amsterdam 1985), p.3
R.B.Laibowitz etal.: Appl. Phys. Lett., 35, p.891, (1979
R.Voss, etal.: Appl. Phys. Lett., 37, p.656, (1980)
P.Chaudhari, A.N.Broers, C.C.Chi, R.B.Laibowitz, E.Spiller and J.Viggiano: Physics Review Letters, 45, p.930, (1980)
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© 1986 Springer-Verlag Berlin Heidelberg
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Broers, A.N. (1986). High Resolution Lithography (Some Comments on Limits and Future Possibilities). In: Kelly, M.J., Weisbuch, C. (eds) The Physics and Fabrication of Microstructures and Microdevices. Springer Proceedings in Physics, vol 13. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-71446-7_1
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DOI: https://doi.org/10.1007/978-3-642-71446-7_1
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