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Picosecond Josephson Logic Gates for Digital LSIs

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Book cover Picosecond Electronics and Optoelectronics

Part of the book series: Springer Series in Electrophysics ((SSEP,volume 21))

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Abstract

Because of its high-speed properties and low power-dissipation, the Josephson junction digital integrated circuits (JJ IC) have been intensively investigated especially for applications in high performance digital systems. The high-speed properties of the JJ IC can be attributed to the quantum-effect-dominating switching speed as well as the light-velocity signal transmission between gates. A wide gate operation margin, multiple logic function capability, and a small gate size are among other important factors in the evaluation of the JJ logic gates. The small gate size is, in particular, very important because it make it possible to densely pack the logic gates and to shorten the signal transmission line length.

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References

  1. J. Sone, T. Yoshida, H. Abe: Appl. Phys. Lett. 40, 741 (1982)

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Author information

Authors and Affiliations

  1. NEC Corporation, 1-1, Miyazaki 4-Chome, Miyamae-ku, Kawasaki, Kanagawa 213, Japan

    Jun’ichi Sone, Jaw-Shen Tsai & Hiroyuki Abe

Authors
  1. Jun’ichi Sone
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  2. Jaw-Shen Tsai
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  3. Hiroyuki Abe
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Editor information

Editors and Affiliations

  1. Department of Physics, The University of Rochester, Rochester, NY, 14627, USA

    Gerard Albert Mourou

  2. Edward L. Ginzton Laboratory, Stanford University, Stanford, CA, 94305, USA

    David M. Bloom

  3. Department of Electrical Engineering, University of Maryland, College Park, MD, 20742, USA

    Chi-H. Lee

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© 1985 Springer-Verlag Berlin Heidelberg

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Sone, J., Tsai, JS., Abe, H. (1985). Picosecond Josephson Logic Gates for Digital LSIs. In: Mourou, G.A., Bloom, D.M., Lee, CH. (eds) Picosecond Electronics and Optoelectronics. Springer Series in Electrophysics, vol 21. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-70780-3_51

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  • DOI: https://doi.org/10.1007/978-3-642-70780-3_51

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-70782-7

  • Online ISBN: 978-3-642-70780-3

  • eBook Packages: Springer Book Archive

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