Abstract
The use of gratings to couple optical energy into surface plasma wave (SPW) modes that are confined to a metal-dielectric boundary has been extensively explored [1]. With optimal choices of the grating period and profile, nearly 100% coupling efficiency has been achieved in wavelength ranges where the metal is normally almost totally reflecting. We report the use of this coupling to enhance the quantum efficiency of internal-photoemission detectors in which hot carriers, generated in a metal film by optical absorption, are collected by photoemission over a Schottky barrier into a semiconductor. This class of detectors is of interest as a result of its uniformity, high-speed potential, long wavelength response with binary rather than quaternary III–V compounds, and compatibility with integrated circuit fabrication techniques [2–4]. For metal-silicide/Si systems, which have been the most thoroughly explored, techniques such as back-illumination and double-pass insulator-metal overlayer structures already provide quite high absorption (> 40%) at infrared wavelengths. Surface texturing has also been used to enhance the responsivity of metal-insulator-metal tunnel junction detectors and of metal-(a-Si)-metal detectors [5,6].
This research was supported by the Department of the Air Force, in part with specific funding from the Air Force Office of Scientific Research.
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Brueck, S.R.J., Diadiuk, V., Jones, T., Lenth, W. (1985). High-Speed Internal Photoemission Detectors Enhanced by Grating Coupling to Surface Plasma Waves. In: Mourou, G.A., Bloom, D.M., Lee, CH. (eds) Picosecond Electronics and Optoelectronics. Springer Series in Electrophysics, vol 21. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-70780-3_38
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DOI: https://doi.org/10.1007/978-3-642-70780-3_38
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