Abstract
Picosecond optoelectronics provides the capability to measure the frequency response of solid state devices with much greater bandwidth than conventional techniques. Laser-triggered switches acted as pulse generators and samplers to measure the impulse response of a device with a temporal resolution of a few picoseconds. Fourier analysis of the impulse response functions yields scattering matrix parameters with a frequency bandwidth of 40 GHz or more. In comparison, current frequency-domain technology is limited to a 26 GHz bandwidth. (Higher frequencies can be covered with frequency mixing techniques, at the cost of additional noise and experimental complexity.)
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsPreview
Unable to display preview. Download preview PDF.
REFERENCES
Donald E. Cooper, “Picosecond Optoelectronic Measurement of Microstrip Dispersion,” to be published in Appl. Phys. Lett.
P. R. Smith, D. H. Auston, A. M. Johnson, and W. M. Augustyniak, Appl. Phys. Lett. 38, p. 47 (1981).
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1985 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Cooper, D.E., Moss, S.C. (1985). Picosecond Optoelectronic Diagnostics of Field Effect Transistors. In: Mourou, G.A., Bloom, D.M., Lee, CH. (eds) Picosecond Electronics and Optoelectronics. Springer Series in Electrophysics, vol 21. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-70780-3_11
Download citation
DOI: https://doi.org/10.1007/978-3-642-70780-3_11
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-70782-7
Online ISBN: 978-3-642-70780-3
eBook Packages: Springer Book Archive