Picosecond Electro-Electron Optic Oscilloscope

  • S. Williamson
  • G. A. Mourou
Part of the Springer Series in Electrophysics book series (SSEP, volume 21)

Abstract

The technique of electro-optic sampling [1, 2, 3] presently offers the only means by which an electrical waveform can be time-resolved with subpicosecond resolution. With a sensitivity of ~l mV and the capability of sampling in a contactless configuration, this technique has become a valuable tool for the characterization of ultrafast electronic components. The contactless mode of sampling can also be scaled up to allow sampling on a plane surface permitting the evaluation of any number of discrete components within an integrated circuit. In spite of these attractive features, the electro-optic sampling technique has been adopted by only a few large laboratories, the major drawback being the requirement of a short pulse laser system. The complexity of such a laser results in a sampling oscilloscope that is delicate, maintenance intensive, and expensive, precluding its development in industry and many universities.

Keywords

Attenuation GaAs Assure Sine 

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References

  1. 1.
    J. A. Valdmanis, G. A. Mourou, and C. W. Gabel, Appl. Phys. Lett. 41, 211 (1982).CrossRefGoogle Scholar
  2. 2.
    J. A. Valdmanis, G. A. Mourou, and C. W. Gabel, IEEE J. Quantum Electron. QE-17, 664 (1983).CrossRefGoogle Scholar
  3. 3.
    G. A. Mourou and K. E. Meyer, Appl. Phys. Lett. 45, 492 (1984).CrossRefGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1985

Authors and Affiliations

  • S. Williamson
    • 1
  • G. A. Mourou
    • 1
  1. 1.Laboratory for Laser EnergeticsUniversity of RochesterRochesterUSA

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