Picosecond Electro-Electron Optic Oscilloscope

  • S. Williamson
  • G. A. Mourou
Part of the Springer Series in Electrophysics book series (SSEP, volume 21)


The technique of electro-optic sampling [1, 2, 3] presently offers the only means by which an electrical waveform can be time-resolved with subpicosecond resolution. With a sensitivity of ~l mV and the capability of sampling in a contactless configuration, this technique has become a valuable tool for the characterization of ultrafast electronic components. The contactless mode of sampling can also be scaled up to allow sampling on a plane surface permitting the evaluation of any number of discrete components within an integrated circuit. In spite of these attractive features, the electro-optic sampling technique has been adopted by only a few large laboratories, the major drawback being the requirement of a short pulse laser system. The complexity of such a laser results in a sampling oscilloscope that is delicate, maintenance intensive, and expensive, precluding its development in industry and many universities.


Streak Camera Sampling Oscilloscope Transmission Point Electrical Waveform Converse Approach 
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  1. 1.
    J. A. Valdmanis, G. A. Mourou, and C. W. Gabel, Appl. Phys. Lett. 41, 211 (1982).CrossRefGoogle Scholar
  2. 2.
    J. A. Valdmanis, G. A. Mourou, and C. W. Gabel, IEEE J. Quantum Electron. QE-17, 664 (1983).CrossRefGoogle Scholar
  3. 3.
    G. A. Mourou and K. E. Meyer, Appl. Phys. Lett. 45, 492 (1984).CrossRefGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1985

Authors and Affiliations

  • S. Williamson
    • 1
  • G. A. Mourou
    • 1
  1. 1.Laboratory for Laser EnergeticsUniversity of RochesterRochesterUSA

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