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Testprobleme bei Höchstintegrierten Schaltungen

  • J. Mucha
Part of the Informatik-Fachberichte book series (INFORMATIK, volume 89)

Zusammenfassung

Herkömmliche Testverfahren sind für den Test von VLSI-Komponenten ungeeignet. Die Ursachen liegen in der von der Großintegration bevorzugt verwendeten CMOS-Technologie und in der Komplexität der Prüflinge. Die einzelnen Probleme werden beschrieben und Lösungswege, soweit erkennbar, aufgezeigt.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1984

Authors and Affiliations

  • J. Mucha
    • 1
  1. 1.Institut für Theoretische ElektotechnikUniversität HannoverHannover 1Deutschland

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