Abstract
With increasing integration level and circuit complexity toward VLSI, an advanced high technology is required in every part of the production of integrated circuits. Consequently, concerning test and evaluation technology there are several new problems, and it is required to establish new basic technologies for VLSI-testing.
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© 1986 Springer-Verlag Berlin Heidelberg
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Tarui, Y. (1986). Fundamentals of Test and Evaluation. In: Tarui, Y. (eds) VLSI Technology. Springer Series in Electrophysics, vol 12. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-69192-8_7
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DOI: https://doi.org/10.1007/978-3-642-69192-8_7
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-69194-2
Online ISBN: 978-3-642-69192-8
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