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Ultrathin-Layer Isoelectric Focusing of Subtypes of Gc, Tf, Pi, and PGM1

Ultradiünnschichtisoelektrofokussierung der Subtypen von Gc, Tf, Pi und PGM1

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Biomathematical Evidence of Paternity / Biomathematischer Beweis der Vaterschaft

Summary

Methods of isoelectric focusing in ultrathin-layer gels of 0.1 mm thickness on silanized films for separating subtypes of Gc, Tf, Pi and PGM1 are described and the application and usefulness in paternity testing is discussed.

Zusammenfassung

Es wird eine Isoelektrofokussierungsmethode in ultradünnen Gelen (0,1 mm) auf silanisierten Folien zur Bestimmung der Subtypen von Gc, Tf, Pi and PGMX beschrieben und deren Anwendung und Nutzen für die Vaterschaftsbegutachtung diskutiert.

With technical assistance of Petra Bogdanski

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References

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Authors and Affiliations

  1. Institut für Humangenetik, Universität Hamburg, Butenfeld 32, D-2000, Hamburg 54, Germany

    H. Goedde, H.-G. Benkmann & L. Hirth

Authors
  1. H. Goedde
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  2. H.-G. Benkmann
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  3. L. Hirth
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Editor information

Editors and Affiliations

  1. Instituts für Blutgruppenserologie, Albrecht-Ludwigs-Universität, Hermann-Herder-Straße 11, 7800, Freiburg I. Br., Germany

    Konrad Hummel (Direktor) (Direktor)

  2. Zentrums der Rechtsmedizin, Klinikum der Johann Wolfgang von Goethe-Universität, Kennedy-Allee 104, 6000, Frankfurt/Main, Germany

    Joachim Gerchow (Geschäftführender Direktor) (Geschäftführender Direktor)

  3. Instituts für Blutgruppenserologie, Universität Freiburg, Bundesrepublik, Deutschland

    Konrad Hummel (Direktor) (Direktor)

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© 1981 Springer-Verlag Berlin Heidelberg

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Goedde, H., Benkmann, HG., Hirth, L. (1981). Ultrathin-Layer Isoelectric Focusing of Subtypes of Gc, Tf, Pi, and PGM1 . In: Hummel, K., Gerchow, J. (eds) Biomathematical Evidence of Paternity / Biomathematischer Beweis der Vaterschaft. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-68341-1_14

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  • DOI: https://doi.org/10.1007/978-3-642-68341-1_14

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-11133-7

  • Online ISBN: 978-3-642-68341-1

  • eBook Packages: Springer Book Archive

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