Surface and In-Depth Analysis of Anodic Oxide Layers on Cd0.2Hg0.8Te

  • A. Benninghoven
  • O. Ganschow
  • U. Kaiser
  • J. Neelsen
  • L. Wiedmann
  • H. Brendecke
  • H. Maier
  • U. Ziegler
Conference paper
Part of the Springer Series in Electrophysics book series (SSEP, volume 7)

Abstract

Cadmium mercury telluride, Cd0.2Hg0.8Te (CMT), is well suited for detectors in the far infrared because of its band structure. The control of its electrical properties, however, poses some severe problems to both the semiconductor and the surface scientist. Anodic oxide layers on CMT grown in KOH ethylene glycol solution to different thickness are of special interest, because they are used for passivation of the surface.

Keywords

Mercury Cadmium Ethylene Glycol Auger 

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Copyright information

© Springer-Verlag Berlin Heidelberg 1981

Authors and Affiliations

  • A. Benninghoven
    • 1
  • O. Ganschow
    • 1
  • U. Kaiser
    • 1
  • J. Neelsen
    • 1
  • L. Wiedmann
    • 1
  • H. Brendecke
    • 2
  • H. Maier
    • 2
  • U. Ziegler
    • 2
  1. 1.Physikalisches Institutder Universität MünsterMünsterFed. Rep. of Germany
  2. 2.AEG-TelefunkenHeilbronnFed. Rep. of Germany

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