Surface and In-Depth Analysis of Anodic Oxide Layers on Cd0.2Hg0.8Te
Cadmium mercury telluride, Cd0.2Hg0.8Te (CMT), is well suited for detectors in the far infrared because of its band structure. The control of its electrical properties, however, poses some severe problems to both the semiconductor and the surface scientist. Anodic oxide layers on CMT grown in KOH ethylene glycol solution to different thickness are of special interest, because they are used for passivation of the surface.
KeywordsAuger Electron Spectroscopy Cadmium Mercury Telluride Depletion Profile Anodic Oxide Layer Thermal Desorption Mass Spectroscopy
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