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Breakdown and Wearout Phenomena in SiO2

  • D. R. Wolters
Part of the Springer Series in Electrophysics book series (SSEP, volume 7)

Abstract

Technological improvements have largely cancelled the effects of contaminations but the mechanisms of shorting at high and medium fields have not been understood so well. New experimental evidence is incompatible with existing breakdown theories. Novel electrical testing techniques have given evidence that charge incorporation or charge flux through the dielectric plays an essential role in the deterioration of the insulator. In the absence of a sound theory a model will be discussed assuming gaseous discharges.

Keywords

Field Strength Oxide Thickness Field Enhancement Thickness Dependence Field Breakdown 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1981

Authors and Affiliations

  • D. R. Wolters
    • 1
  1. 1.Philips Research LaboratoriesEindhovenThe Netherlands

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