Abstract
Once the individual layer diffraction matrices are known (as obtained by any of the methods described in Chaps. 5–7), the total diffraction by a stack of such layers can be calculated by either the Layer Doubling method described below or the Renormalized Forward Scattering method (Chap. 9).
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Author information
Authors and Affiliations
Rights and permissions
Copyright information
© 1979 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Van Hove, M.A., Tong, S.Y. (1979). Stacking Layers by Layer Doubling. In: Surface Crystallography by LEED. Springer Series in Chemical Physics, vol 2. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-67195-1_8
Download citation
DOI: https://doi.org/10.1007/978-3-642-67195-1_8
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-67197-5
Online ISBN: 978-3-642-67195-1
eBook Packages: Springer Book Archive