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Stacking Layers by Layer Doubling

  • Michel A. Van Hove
  • Shuk Yin Tong
Part of the Springer Series in Chemical Physics book series (CHEMICAL, volume 2)

Abstract

Once the individual layer diffraction matrices are known (as obtained by any of the methods described in Chaps. 5–7), the total diffraction by a stack of such layers can be calculated by either the Layer Doubling method described below or the Renormalized Forward Scattering method (Chap. 9).

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Copyright information

© Springer-Verlag Berlin Heidelberg 1979

Authors and Affiliations

  • Michel A. Van Hove
    • 1
  • Shuk Yin Tong
    • 2
  1. 1.Materials and Molecular Research Division, Lawrence Berkeley Laboratory and Department of ChemistryUniversity of CaliforniaBerkeleyUSA
  2. 2.Surface Studies Laboratory, Department of PhysicsUniversity of Wisconsin-MilwaukeeMilwaukeeUSA

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