Abstract
Heavy charged particles produce damage trails (tracks) near the end of their range as they are brought to rest in dielectric materials (e.g. Fleischer et al., 1965). This discovery has been applied to problems in disciplines as diverse as anthropology and particle physics. In this short report we describe how electron microscopy is being used in studies of particle tracks, and illustrate with examples drawn mainly from our own work. For the interested reader, details of track formation, track sources, and experimental methods are extensively described in the literature (e.g. Fleischer et al., 1965; Lal, 1972; Lai et al., 1968; Macdougall et al., 1971; Price and Fleischer, 1971; Price et al., 1973a).
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Hutcheon, I.D., Macdougall, J.D. (1976). Particle Track Studies. In: Wenk, HR. (eds) Electron Microscopy in Mineralogy. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-66196-9_41
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DOI: https://doi.org/10.1007/978-3-642-66196-9_41
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