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Cluster Formation in SIMS: CO on PdAg

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Book cover Secondary Ion Mass Spectrometry SIMS II

Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 9))

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Abstract

The technique of Secondary Ion Mass Spectrometry (SIMS) reportedly has great promise in the determination of local order structure of the top surface layer. A key possibility of this technique is that the composition and abundance of the cluster ions reflect to some degree the geometrical arrangement of reacted atoms on the surface. However, the information available in the cluster ions lies unused for lack of a coherent theory capable of explaining the way in which the cluster ions are formed. Probably the most important missing part of our understanding lies in the determination of whether or not the cluster ions leave the surface as intact species.

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Author information

Authors and Affiliations

  1. IBM General Technology Division, Essex Junction, Vermont, 05452, USA

    George J. Slusser

Authors
  1. George J. Slusser
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Editor information

Editors and Affiliations

  1. Physikalisches Institut der Universität Münster, Germany

    A. Benninghoven

  2. Charles Evans & Associates, San Mateo, CA, 94402, USA

    C. A. Evans Jr.

  3. Varian Associates, Palo Alto, CA, 94303, USA

    R. A. Powell

  4. Osaka University, Osaka, Japan

    R. Shimizu

  5. General Electric Vallecitos Nuclear Center, Pleasanton, CA, 94566, USA

    H. A. Storms

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© 1979 Springer-Verlag New York

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Slusser, G.J. (1979). Cluster Formation in SIMS: CO on PdAg. In: Benninghoven, A., Evans, C.A., Powell, R.A., Shimizu, R., Storms, H.A. (eds) Secondary Ion Mass Spectrometry SIMS II. Springer Series in Chemical Physics, vol 9. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-61871-0_7

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  • DOI: https://doi.org/10.1007/978-3-642-61871-0_7

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-61873-4

  • Online ISBN: 978-3-642-61871-0

  • eBook Packages: Springer Book Archive

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