Skip to main content

Study of Inorganic Salts by Static and Dynamic Secondary Ion Mass Spectrometry (SIMS)

  • Conference paper
Secondary Ion Mass Spectrometry SIMS II

Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 9))

Abstract

Up to now, many works in SIMS (see [1] and Refs. 1,2,5,8,9 therein) have been devoted to the study of the various phases (oxidation state of the metal) present in an oxidized metal. We have extended this kind of study to inorganic salts in which the metalloid is in various oxidation states. Therefore, we have investigated sulfate, sulfite, nitrate and nitrite salts using static and dynamic SIMS. Our purpose was to check the usefulness of the molecular information obtained from these systems and especially to see if the oxidation state of the metalloid can be deduced from the spectra. We also looked for possible artifacts induced by the ion beam and tried to follow chemical reactions on the surface of the salts.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 84.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. J. Marien and E. De Pauw, Bull. Soc. Chim. Belg. 38, 115 (1979).

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 1979 Springer-Verlag New York

About this paper

Cite this paper

Pauw, E.D., Marien, J. (1979). Study of Inorganic Salts by Static and Dynamic Secondary Ion Mass Spectrometry (SIMS). In: Benninghoven, A., Evans, C.A., Powell, R.A., Shimizu, R., Storms, H.A. (eds) Secondary Ion Mass Spectrometry SIMS II. Springer Series in Chemical Physics, vol 9. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-61871-0_41

Download citation

  • DOI: https://doi.org/10.1007/978-3-642-61871-0_41

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-61873-4

  • Online ISBN: 978-3-642-61871-0

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics