Abstract
Since the early days of SIMS [1–4] molecular ion emission has been a well-known phenomenon. For example, secondary ions of the general composition CmHn ± were observed in many spectra. These ions disappeared after removal of some monolayers during the sputtering process and were generally attributed to “contaminations” on the surface. There exist, however, some more or less systematic early investigations of molecular ion emission as, e.g., of anion complex emission from inorganic salts [3].
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Benninghoven, A. (1979). Molecular Secondary Ion Emission. In: Benninghoven, A., Evans, C.A., Powell, R.A., Shimizu, R., Storms, H.A. (eds) Secondary Ion Mass Spectrometry SIMS II. Springer Series in Chemical Physics, vol 9. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-61871-0_35
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DOI: https://doi.org/10.1007/978-3-642-61871-0_35
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