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Electronic Structure and Optical Properties of Semiconductors pp 51–72Cite as

Optical and Electronic Spectra of Semiconductors

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Part of the book series: Springer Series in Solid-State Sciences ((SSSOL,volume 75))

Abstract

Optical studies of semiconductors have concentrated on reflectivity measurements as opposed to transmission or absorption measurements. It is possible to measure absorption spectra, but the penetration depth of optical radiation is fairly low in semiconductors. Thus, absorption measurements require the use of thin films which can be difficult to prepare and to calibrate. Reflectivity measurements do not require films, and these measurements are relatively easy to perform: the ratio of the incident photon flux to the reflected photon flux is measured as a function of photon energy. In principle, the only tools required for this procedure are the sample, a light source, a monochrometer, and a detector.

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Author information

Authors and Affiliations

  1. Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, Department of Physics, University of California, Berkeley, CA, 94720, USA

    Professor Marvin L. Cohen PhD

  2. Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN, 55455, USA

    Professor James R. Chelikowsky PhD

Authors
  1. Professor Marvin L. Cohen PhD
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  2. Professor James R. Chelikowsky PhD
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© 1989 Springer-Verlag Berlin Heidelberg

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Cohen, M.L., Chelikowsky, J.R. (1989). Optical and Electronic Spectra of Semiconductors. In: Electronic Structure and Optical Properties of Semiconductors. Springer Series in Solid-State Sciences, vol 75. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-61338-8_6

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  • DOI: https://doi.org/10.1007/978-3-642-61338-8_6

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-51391-9

  • Online ISBN: 978-3-642-61338-8

  • eBook Packages: Springer Book Archive

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