Abstract
In this chapter, we shall present the MOSFET theory and issues that relate to scaling and integration.
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Hori, T. (1997). MOS Fielid-Effect Transistor. In: Gate Dielectrics and MOS ULSIs. Springer Series in Electronics and Photonics, vol 34. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-60856-8_3
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DOI: https://doi.org/10.1007/978-3-642-60856-8_3
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