Abstract
The measurement of the standard laser performance is generally assumed to be quite easy and to require no particular care. The case of semiconductor lasers is, however, more complicated. Under standard working conditions, semiconductor lasers have a material gain coefficient much higher than the other lasers and a dependence of the refractive index on the gain. These features, together with the low Q factor of a typical semiconductor-laser cavity make these devices very sensitive to external reflections. This reflects on an intrinsic difficulty in performing reliable measurements.
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Paoletti, R., Spano, P. (1999). Measurements on DFB lasers. In: Guekos, G. (eds) Photonic Devices for Telecommunications. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-59889-0_8
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DOI: https://doi.org/10.1007/978-3-642-59889-0_8
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