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Characterization of Microscopic Stress States in Polycrystalline Materials

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Part of the book series: Advances in the statistical sciences ((ASS,volume 6))

Abstract

Stress analyses using X-ray or neutron-ray diffraction are well established methods to study the stresses within the phases of polycrystalline materials. But, especially after plastic deformation the stresses of the crystallites depend on their orientation within the material and may differ essentially between each other. To derive as well the orientation dependence of the crystallite stresses a new evaluation method has been developed and is presented in the paper.

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References

  1. V. Hauk: Structural and Residual Stress Analysis by Nondestructive Methods (Elsevier, Amsterdam 1997).

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  6. H. Behnken, 6th Europ. Conf. Residual Stresses, Coimbra, 2002, in the press.

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  7. H. Behnken, Mater. Sci. Forum, Vols. 347–349 (2000), 273–278.

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© 2003 Springer-Verlag Berlin Heidelberg

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Behnken, H. (2003). Characterization of Microscopic Stress States in Polycrystalline Materials. In: Green, R.E., Djordjevic, B.B., Hentschel, M.P. (eds) Nondestructive Characterization of Materials XI. Advances in the statistical sciences, vol 6. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-55859-7_28

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  • DOI: https://doi.org/10.1007/978-3-642-55859-7_28

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-62481-0

  • Online ISBN: 978-3-642-55859-7

  • eBook Packages: Springer Book Archive

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