Synchrotron Radiation Refraction Topography

Abstract

The employment of synchrotron radiation for Refraction Topography of materials has considerable advantages over standard X-ray sources. The much higher beam intensity and the parallel and monochromatic radiation provide faster measurements and better angular and spatial resolution. X-ray refraction techniques image the inner surface and interface concentration of micro structured materials. This effect of X-ray optics is additional to small angle scattering by diffraction, when the scattering objects reach micro meter dimensions. We have developed X-ray refraction techniques within the last decade in order to meet the growing demands for improved non-destructive characterization of high performance composites, ceramics and other low density materials. Sub-micron particles dimensions, the pore size of ceramics, the crack density distribution and single fibre debonding within damaged composites can be measured and visualized by computer generated interface topographs. For this purpose the investigations are being performed now at the new hard X-ray beamline of the Federal Institute for Materials Research and Testing (BAM) at BESSY, Berlin. This BAMline provides monochromatic radiation of photon energies from 5 keV to 60 keV from a double multilayer and/or a double crystal monochromator respectively. A separate instrument is dedicated to the further development and application of Synchrotron Radiation Refraction (SRR) Topography. Different from conventional small angle scattering cameras with collimating slits and pinholes scattering angles down to a few seconds of arc are selected by a single crystal analyser, similar to a Bonse-Hart diffractometer. 20 μm spatial resolution of the scattering micro structures is achieved by a CCD-camera with a fluorescent converter. First SRR topographs of aircraft composites (carbon fibre reinforced plastics (CFRP), carbon fibre reinforced ceramics (C/C), metal matrix ceramics (MMC) will be reported.